Published June 15, 1978 | Version v1
Journal article Metadata-only

A low-matter beam profile secondary emission monitor

Creators

  • 1. CEA Centre d'Etudes Nucleaires de Saclay, 91 - Gif-sur-Yvette (France). Dept. du Synchrotron Saturne

Description

The authors present a new technology of a secondary emission profile monitor based on a photographic process, which represents an improvement as far as beam disturbance and mechanical reliability are concerned. The amount of matter is 1.0 mg/cm2 per grid-plane. (Auth.)

Additional details

Identifiers

DOI
10.1016/0029-554x(78)90037-x;

Publishing Information

Journal Title
Nuclear Instruments and Methods
Journal Volume
152
Journal Issue
2-3
Series
Nucl. Instrum. Methods.
Journal Page Range
395-398
ISSN
0029-554X

INIS

Country of Publication
Netherlands
Country of Input or Organization
Netherlands
INIS RN
9418338
Subject category
S43: PARTICLE ACCELERATORS;
Descriptors DEI
ALPHA BEAMS; BEAM MONITORS; BEAM PROFILES; DEUTERON BEAMS; GEV RANGE 01-10; MEV RANGE 100-1000; PHOTOGRAPHIC EMULSIONS; PROTON BEAMS; RELIABILITY; SATURNE; SECONDARY EMISSION DETECTORS; SPATIAL DISTRIBUTION; SPECIFICATIONS; SPECTROSCOPY; TUNING
Descriptors DEC
ACCELERATORS; BEAMS; CYCLIC ACCELERATORS; DISTRIBUTION; ENERGY RANGE; GEV RANGE; HELIUM 4 BEAMS; ION BEAMS; MEASURING INSTRUMENTS; MEV RANGE; NUCLEON BEAMS; PARTICLE BEAMS; RADIATION DETECTORS; SYNCHROTRONS

Optional Information

Notes
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