Gate voltage oscillation model and suppression method for enhancement-mode GaN devices in half-bridge circuits
Creators
- 1. Fundamentals Department, Air Force Engineering University, Xi'an, 710051 (China)
- 2. The School of Microelectronics, Xidian University, Xi'an, 710071 (China)
- 3. The School of Electrical Engineering, Xi'an University of Technology, Xi'an, 710048 (China)
Description
This article analyzes the issue of gate voltage oscillations in AlGaN/GaN high electron mobility transistors based on the half-bridge circuit. With the influence of the parasitic parameters, the variation of high drain-source voltage (V) can affect the gate-source voltage (V), thus resulting in serious gate voltage oscillations, which may cause over-voltage, false turn-on/off, and even gate breakdown. A large-signal model is proposed to study this oscillations phenomenon. The oscillation model of V is proposed as a step response of V. Based on the model, the influence of V and circuit parameters on V are investigated, and guidelines to suppress the oscillation are given. Reducing the gate and power loop inductance in PCB wiring and increasing the gate resistance of inactive switch can significantly suppress the oscillation. Finally, the model is verified by both simulation results and experimental results. (© 2023 Wiley‐VCH GmbH)
Availability note (English)
Available from: http://dx.doi.org/10.1002/pssa.202300296Additional details
Identifiers
Publishing Information
- Journal Title
- Physica Status Solidi. A, Applications and Materials Science (Online)
- Journal Volume
- 220
- Journal Issue
- 19
- Journal Page Range
- p. 1-7
- ISSN
- 1862-6319
- CODEN
- PSSABA
INIS
- Country of Publication
- Germany
- Country of Input or Organization
- Germany
- INIS RN
- 54124342
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S36: MATERIALS SCIENCE;
- Descriptors DEI
- ALUMINIUM NITRIDES; BREAKDOWN; CAPACITANCE; ELECTRON MOBILITY; EQUIVALENT CIRCUITS; FIELD EFFECT TRANSISTORS; GALLIUM NITRIDES; INDUCTANCE; OSCILLATIONS; SWITCHES; WAVE FORMS
- Descriptors DEC
- ALUMINIUM COMPOUNDS; ELECTRICAL EQUIPMENT; ELECTRICAL PROPERTIES; ELECTRONIC CIRCUITS; EQUIPMENT; GALLIUM COMPOUNDS; MOBILITY; NITRIDES; NITROGEN COMPOUNDS; PARTICLE MOBILITY; PHYSICAL PROPERTIES; PNICTIDES; SEMICONDUCTOR DEVICES; TRANSISTORS
Optional Information
- Notes
- AID: 2300296