Published October 2023 | Version v1
Journal article

Gate voltage oscillation model and suppression method for enhancement-mode GaN devices in half-bridge circuits

  • 1. Fundamentals Department, Air Force Engineering University, Xi'an, 710051 (China)
  • 2. The School of Microelectronics, Xidian University, Xi'an, 710071 (China)
  • 3. The School of Electrical Engineering, Xi'an University of Technology, Xi'an, 710048 (China)

Description

This article analyzes the issue of gate voltage oscillations in AlGaN/GaN high electron mobility transistors based on the half-bridge circuit. With the influence of the parasitic parameters, the variation of high drain-source voltage (Vds) can affect the gate-source voltage (Vgs), thus resulting in serious gate voltage oscillations, which may cause over-voltage, false turn-on/off, and even gate breakdown. A large-signal model is proposed to study this oscillations phenomenon. The oscillation model of Vgs is proposed as a step response of Vds. Based on the model, the influence of Vds and circuit parameters on Vgs are investigated, and guidelines to suppress the oscillation are given. Reducing the gate and power loop inductance in PCB wiring and increasing the gate resistance of inactive switch can significantly suppress the oscillation. Finally, the model is verified by both simulation results and experimental results. (© 2023 Wiley‐VCH GmbH)

Availability note (English)

Available from: http://dx.doi.org/10.1002/pssa.202300296

Additional details

Identifiers

Publishing Information

Journal Title
Physica Status Solidi. A, Applications and Materials Science (Online)
Journal Volume
220
Journal Issue
19
Journal Page Range
p. 1-7
ISSN
1862-6319
CODEN
PSSABA

Optional Information

Notes
AID: 2300296