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Published August 2019 | Version v1
Journal article

Compact model of millimeter wave noise in nano-MOSFET

  • 1. School of Information Engineering, Southwest University of Science and Technology, Mianyang (China)

Description

In order to apply the complex physical model of millimeter-wave noise of nano-MOSFET to engineering design, the expression of its compact model is studied. The complex noise physical model is simplified by transforming and analyzing the two-port correlation noise matrix of the device. The compact model proposed here not only expresses the non-quasi-static effect of the device with high precision, but also can be directly embedded into the ADS simulation design tool by Verilog-A language in the form of four nodes, thus ensuring the accuracy and greatly reducing the design complexity. The experimental results show that the proposed model is more accurate in both strong and weak inversion regions than the existing three-node model. (authors)

Additional details

Identifiers

Publishing Information

Journal Title
High Power Laser and Particle Beams
Journal Volume
31
Journal Issue
8
Journal Page Range
[5 p.]
ISSN
1001-4322

INIS

Country of Publication
China
Country of Input or Organization
China
INIS RN
55057865
Subject category
S42: ENGINEERING; S97: MATHEMATICAL METHODS AND COMPUTING;
Descriptors DEI
ACCURACY; CORRELATIONS; DESIGN; ENGINEERING; MATRICES; MOSFET; SIMULATION; V CODES
Descriptors DEC
COMPUTER CODES; FIELD EFFECT TRANSISTORS; MOS TRANSISTORS; SEMICONDUCTOR DEVICES; TRANSISTORS

Optional Information

Notes
3 figs., 9 refs.; http://dx.doi.org/10.11884/HPLPB201931.190059