The structure of artificial grain boundaries in yttrium stabilized ZrO2 bicrystals with intermediate layers

Results of transmission electron microscopy and X-ray microanalysis investigation of artificial grain boundaries (AGBs) in Y-stabilized ZrO2 (YSZ) bicrystals with different intermediate layers are described. Doping elements and intermediate layers were introduced by depositing thin films on the contact surfaces of YSZ crystals prior to the solid phase intergrowth. Depending on the amount and type of deposited material doped AGB, continuous intermediate layer, or nanoscale precipitates at the AGB can be obtained. The orientation of the bicrystal parts affect the structure of the AGB. For relatively small misorientation of adjacent parts faceting and formation of different types of dislocations are revealed. The structures of interfaces between the YSZ and intermediate layers are considered. (orig.)