Perspectives of in situ/operando resonant inelastic X-ray scattering in catalytic energy materials science
Creators
- 1. Advanced Light Source, Lawrence Berkeley National Laboratory, Berkeley, CA 94720 (United States)
- 2. Department of Physics, Tamkang University, Tamsui 250, Taiwan, ROC (China)
- 3. Center for Engineering Concepts Development, Department of Mechanical Engineering, University of Maryland, College Park, MD 20742 (United States)
- 4. Department of Chemistry and Biochemistry, University of California, Santa Cruz, CA 95064 (United States)
Description
Highlights: • In-situ/operando soft X-ray RXES and RIXS offer unique perspectives in the energy material science. - Abstract: Growing environmental concerns have renewed the interest for light induced catalytic reactions to synthesize cleaner chemical fuels from syngas. This, however, requires a sound understanding for the dynamics taking place at molecular level as a result of light – matter interaction. We present herein the principles of soft X-ray resonant emission spectroscopy (RXES) and resonant inelastic scattering (RIXS) and the importance of these spectroscopic techniques in materials science in light of their unique ability to emanate characteristic fingerprints on the geometric structure, chemical bonding charge and spin states in addition to chemical sensitivity. The addition of in situ/operando RXES and RIXS capability offers new opportunities to project important material properties and functionalities under conditions nearly identical to the operational modes.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.elspec.2015.07.004Additional details
Identifiers
- DOI
- 10.1016/j.elspec.2015.07.004;
- PII
- S0368-2048(15)00149-8;
Publishing Information
- Journal Title
- Journal of Electron Spectroscopy and Related Phenomena
- Journal Volume
- 200
- Journal Page Range
- p. 282-292
- ISSN
- 0368-2048
- CODEN
- JESRAW
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 48009279
- Subject category
- S73: NUCLEAR PHYSICS AND RADIATION PHYSICS;
- Descriptors DEI
- CHEMICAL BONDS; INELASTIC SCATTERING; SENSITIVITY; SOFT X RADIATION; SPIN; X-RAY DIFFRACTION; X-RAY EMISSION SPECTROSCOPY; X-RAY SPECTROSCOPY
- Descriptors DEC
- ANGULAR MOMENTUM; COHERENT SCATTERING; DIFFRACTION; ELECTROMAGNETIC RADIATION; EMISSION SPECTROSCOPY; IONIZING RADIATIONS; PARTICLE PROPERTIES; RADIATIONS; SCATTERING; SPECTROSCOPY; X RADIATION
Optional Information
- Copyright
- Copyright (c) 2015 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.