Published September 2010 | Version v1
Journal article Metadata-only

Transmission electron microscopy studies on nanometer-sized ω phase produced in Gum Metal

Creators

  • 1. Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, Sendai 980-8577 (Japan)
  • 2. High-voltage Electron Microscopy Laboratory, Tohoku University, Sendai 980-8577 (Japan)
  • 3. Toyota Central Research and Development Laboratories Incorporated, Nagakute, Aichi 480-1192 (Japan)

Description

The morphology, numerical density and average spacing of the ω phase formed in Gum Metal, a Ti-based alloy showing unique mechanical properties, were studied by transmission electron microscopy. Based on dark-field image observations and precise thickness measurements using a thin-foil specimen, the average spacing of the nanometer-sized ω phase was determined to be 6 nm. This spacing appeared to be sufficiently small for trapping dislocations. The results are discussed in conjunction with the dislocation-free deformation mechanism proposed for Gum Metal.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.scriptamat.2010.05.025

Additional details

Identifiers

DOI
10.1016/j.scriptamat.2010.05.025;
PII
S1359-6462(10)00350-7;

Publishing Information

Journal Title
Scripta Materialia
Journal Volume
63
Journal Issue
5
Journal Page Range
p. 536-539
ISSN
1359-6462
CODEN
SCMAF7

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
45024379
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
DEFORMATION; DENSITY; DISLOCATIONS; FOILS; IMAGES; MECHANICAL PROPERTIES; MORPHOLOGY; PHASE STABILITY; THICKNESS; THIN FILMS; TITANIUM BASE ALLOYS; TRANSMISSION ELECTRON MICROSCOPY; TRAPPING
Descriptors DEC
ALLOYS; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; DIMENSIONS; ELECTRON MICROSCOPY; FILMS; LINE DEFECTS; MICROSCOPY; PHYSICAL PROPERTIES; STABILITY; TITANIUM ALLOYS; TRANSITION ELEMENT ALLOYS

Optional Information

Copyright
Copyright (c) 2010 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.