Published November 3, 2009
| Version v1
Journal article
In situ synthesis and photoluminescence of SiC nanowires by microwave-assisted pyrolysis of methane
- 1. School of Materials Science and Engineering, Northwestern Polytechnical University, Xi'an, Shannxi 710072 (China)
- 2. Shenzhen Key Laboratory of Special Functional Materials, Shenzhen 518060 (China)
- 3. College of Materials Science and Engineering, Shenzhen University, Shenzhen 518060 (China)
Description
A simple method was used to synthesize SiC nanowires directly on quartz plate by microwave pyrolysis of methane. The samples have been characterized by field emission scanning electron microscopy, transmission electron microscopy, X-ray diffraction and Raman spectroscopy techniques. The results showed that the nanowires are of cubic β-SiC structure with stacking faults. The diameters of SiC nanowires are in the range of 50-200 nm and their lengths up to several tens of microns. The effect of the reaction gas concentration and the reaction temperature on the morphologies of SiC nanowires was also investigated. Two broad photoluminescence peaks at the center wavelength of about 309 and 417 nm were observed at room temperature.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.jallcom.2009.06.187Additional details
Identifiers
- DOI
- 10.1016/j.jallcom.2009.06.187;
- PII
- S0925-8388(09)01316-4;
Publishing Information
- Journal Title
- Journal of Alloys and Compounds
- Journal Volume
- 486
- Journal Issue
- 1-2
- Journal Page Range
- p. 406-409
- ISSN
- 0925-8388
- CODEN
- JALCEU
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 41119626
- Subject category
- S77: NANOSCIENCE AND NANOTECHNOLOGY;
- Descriptors DEI
- METHANE; MICROWAVE RADIATION; PHOTOLUMINESCENCE; PYROLYSIS; QUANTUM WIRES; RAMAN SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY; SILICON CARBIDES; STACKING FAULTS; TEMPERATURE RANGE 0273-0400 K; TRANSMISSION ELECTRON MICROSCOPY; X-RAY DIFFRACTION
- Descriptors DEC
- ALKANES; CARBIDES; CARBON COMPOUNDS; CHEMICAL REACTIONS; COHERENT SCATTERING; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; DECOMPOSITION; DIFFRACTION; ELECTROMAGNETIC RADIATION; ELECTRON MICROSCOPY; EMISSION; HYDROCARBONS; LASER SPECTROSCOPY; LUMINESCENCE; MICROSCOPY; NANOSTRUCTURES; ORGANIC COMPOUNDS; PHOTON EMISSION; RADIATIONS; SCATTERING; SILICON COMPOUNDS; SPECTROSCOPY; TEMPERATURE RANGE; THERMOCHEMICAL PROCESSES
Optional Information
- Copyright
- Copyright (c) 2009 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.