Published August 2007 | Version v1
Journal article Metadata-only

X-ray diffraction spot mapping - a tool to study structural properties of semiconductor disk laser devices

Creators

  • 1. Ferdinand-Braun-Institut fuer Hoechstfrequenztechnik, Gustav-Kirchhoff-Str. 4, 12489 Berlin (Germany)
  • 2. Forschungszentrum Rossendorf, Bautzener Landstr. 128, 01328 Dresden (Germany)
  • 3. Universitaet Potsdam, Institut fuer Physik, Am Neuen Palais 10, 14415 Potsdam (Germany)
  • 4. Universitaet Siegen, FB7 Physik, 57068 Siegen (Germany)
  • 5. Max-Born-Institut fuer nichtlineare Optik und Kurzzeitspektroskopie, Max-Born-Str. 2a, 12489 Berlin (Germany)

Description

Local lattice plane curvature of semiconductor disk laser devices is determined by an X-ray spot mapping technique using white beam synchrotron radiation. This method allows for in-situ studies of the dependence of the lattice plane profile on device temperature and local heating by optical pumping. The influence of different device mounting procedures on the structural and optical device parameters was investigated. This knowledge was used for device technology optimisation. (copyright 2007 WILEY-VCH Verlag GmbH and Co. KGaA, Weinheim) (orig.)

Availability note (English)

Available from: http://dx.doi.org/10.1002/pssa.200675706

Additional details

Identifiers

DOI
10.1002/pssa.200675706;

Publishing Information

Journal Title
Physica Status Solidi. A, Applied Research
Journal Volume
204
Journal Issue
8
Journal Page Range
p. 2753-2759
ISSN
0031-8965
CODEN
PSSABA

Conference

Title
8. biennial conference on high resolution X-ray diffraction and imaging
Acronym
XTOP 2006
Dates
19-21 Sep 2006
Place
Karlsruhe (Germany)

INIS

Country of Publication
Germany
Country of Input or Organization
Germany
INIS RN
38091305
Subject category
S42: ENGINEERING;
Resource subtype / Literary indicator
Conference
Descriptors DEI
HEATING; OPTICAL PUMPING; OPTICAL SYSTEMS; OPTIMIZATION; SEMICONDUCTOR LASERS; TEMPERATURE DEPENDENCE; TEMPERATURE RANGE 0273-0400 K; X-RAY DIFFRACTION; X-RAY RADIOGRAPHY
Descriptors DEC
COHERENT SCATTERING; DIFFRACTION; INDUSTRIAL RADIOGRAPHY; LASERS; MATERIALS TESTING; NONDESTRUCTIVE TESTING; PUMPING; SCATTERING; SEMICONDUCTOR DEVICES; SOLID STATE LASERS; TEMPERATURE RANGE; TESTING

Optional Information

Notes
With 7 figs., 2 tabs., 5 refs.. SICI: 0031-8965(200708)204:8<2753::AID-PSSA200675706>3.0.TX;2-W