Published June 26, 2000 | Version v1
Journal article

The ultra-small-angle X-ray scattering instrument on UNICAT at the APS

  • 1. National Institute of Standards and Technology, Gaithersburg, Maryland 20899-8523 (United States)
  • 2. University of Maryland, College Park, Maryland 20742 (United States)
  • 3. University of Illinois at Urbana-Champaign, Urbana Illinois 61801 (United States)

Description

A new ultra-small-angle X-ray scattering (USAXS) instrument has been commissioned as part of the UNICAT facility on the 33-ID line at the Advanced Photon Source. The instrument offers continuously-tunable optics for anomalous USAXS, 1000 times the throughput of earlier USAXS instruments1,2, high sensitivity and high resolution at low scattering vector, and a scattering vector range from below 0.00015 Aa-1 to above 0.5 Aa-1. Early results include USAXS from colloidal silica suspensions, and anomalous USAXS from rare-earth oxides in the presence of similarly-sized cavities in silicon nitride. The addition of side-reflection optics, in an optional configuration of this instrument, enables USAXS measurements of anisotropic as well as isotropic materials

Additional details

Identifiers

Publishing Information

Journal Title
AIP Conference Proceedings
Journal Volume
521
Journal Issue
1
Journal Page Range
p. 183-187
ISSN
0094-243X
CODEN
APCPCS

Conference

Title
11. US national conference on synchrotron radiation instrumentation
Acronym
SRI99
Dates
13-15 Oct 1999
Place
Stanford, CA (United States)

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
35041242
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ADVANCED PHOTON SOURCE; COLLOIDS; RARE GAS COMPOUNDS; RESOLUTION; SENSITIVITY; SILICA; SILICON NITRIDES; SMALL ANGLE SCATTERING; X-RAY SPECTROSCOPY
Descriptors DEC
DISPERSIONS; MINERALS; NITRIDES; NITROGEN COMPOUNDS; OXIDE MINERALS; PNICTIDES; RADIATION SOURCES; SCATTERING; SILICON COMPOUNDS; SPECTROSCOPY; STORAGE RINGS; SYNCHROTRON RADIATION SOURCES

Optional Information

Notes
(c) 2000 American Institute of Physics.