Published May 21, 2011 | Version v1
Journal article

A new family of pixel detectors for high frame rate X-ray applications

Description

We are developing a new family of hybrid, single photon counting X-ray detectors for very high frame rate applications. A dedicated readout chip was designed, to be used as building block for detectors up to 9 Mpixel and about 550cm2 area. It has an area of 19.3x20.0mm2 and contains 256x256 pixels of 75x75μm2, resulting in an active region of 19.2x19.2mm2. Each pixel contains a 12 bit counter with double buffering for continuous image acquisition. Moreover, it allows a partial readout (4, 8 or 12 bits) with corresponding frame rates up to 24, 12 and 8 kHz. The chip is designed with Hardening By Design techniques , to obtain high radiation tolerance from a standard commercial 0.25μm CMOS technology. The chip was recently received from fabrication and it is at present under test.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.nima.2009.10.043

Additional details

Identifiers

DOI
10.1016/j.nima.2009.10.043;
PII
S0168-9002(09)01948-2;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
Journal Volume
617
Journal Issue
1-3
Journal Page Range
p. 384-386
ISSN
0168-9002
CODEN
NIMAER

Conference

Title
11. Pisa meeting on advanced detectors
Dates
24-30 May 2009
Place
La Biodola, Elba (Italy)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
42009423
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
DESIGN; FABRICATION; HARDENING; KHZ RANGE; PHOTONS; READOUT SYSTEMS; STANDARDS; SYNCHROTRON RADIATION; TOLERANCE; X RADIATION
Descriptors DEC
BOSONS; BREMSSTRAHLUNG; ELECTROMAGNETIC RADIATION; ELEMENTARY PARTICLES; FREQUENCY RANGE; IONIZING RADIATIONS; MASSLESS PARTICLES; RADIATIONS

Optional Information

Copyright
Copyright (c) 2009 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.