Nanometer-scale sharpening and surface roughening of ZnO nanorods by argon ion bombardment
Creators
- 1. School of Basic Sciences, Indian Institute of Technology, Bhubaneswar 751013 (India)
- 2. Tata Institute of Fundamental Research, Homi Bhabha Road, Mumbai 400005 (India)
- 3. Institute of Physics, Sachivalaya Marg, Bhubaneswar 751005 (India)
Description
We report the effects of exposing a hydrothermally grown, single crystalline ZnO nanorod array to a beam of 50 keV argon ions at room temperature. High resolution electron microscopy reveals that the ion bombardment results in a nanometer-scale roughening of the nanorod sidewalls, which were almost atomically flat in the pristine sample. Ion bombardment further causes the flat, ≈100 nm diameter nanorod tips to get sharpened to ultrafine points less than 10 nm across. While tip sharpening is attributed to preferential sputtering, the formation of crystalline surface protuberances can be ascribed to surface instability due to curvature dependent sputtering and surface diffusion under argon-ion bombardment. Both the nanoscale roughening as well as the tip sharpening are expected to favorably impact a wide variety of applications, such as those involving catalysis, gas sensing, solar cells, field emission and gas discharge.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.apsusc.2012.03.157Additional details
Identifiers
- DOI
- 10.1016/j.apsusc.2012.03.157;
- PII
- S0169-4332(12)00596-X;
Publishing Information
- Journal Title
- Applied Surface Science
- Journal Volume
- 258
- Journal Issue
- 18
- Journal Page Range
- p. 7016-7020
- ISSN
- 0169-4332
- CODEN
- ASUSEE
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 44030805
- Subject category
- S77: NANOSCIENCE AND NANOTECHNOLOGY;
- Descriptors DEI
- ARGON IONS; CATALYSIS; DIFFUSION; FIELD EMISSION; ION BEAMS; MONOCRYSTALS; NANOSTRUCTURES; RESOLUTION; SOLAR CELLS; SURFACES; TEMPERATURE RANGE 0273-0400 K; TRANSMISSION ELECTRON MICROSCOPY; ZINC OXIDES
- Descriptors DEC
- BEAMS; CHALCOGENIDES; CHARGED PARTICLES; CRYSTALS; DIRECT ENERGY CONVERTERS; ELECTRON MICROSCOPY; EMISSION; EQUIPMENT; IONS; MICROSCOPY; OXIDES; OXYGEN COMPOUNDS; PHOTOELECTRIC CELLS; PHOTOVOLTAIC CELLS; SOLAR EQUIPMENT; TEMPERATURE RANGE; ZINC COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2012 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.