Published March 2014 | Version v1
Journal article

Determination of Doping Density in GaAs Semiconductor by Wavelength-Dependent Photoacoustic Spectroscopy

  • 1. Yonsei Univ., Seoul (Korea, Republic of)

Description

The wavelength dependence of the photoacoustic signal for n-type GaAs semiconductors in the region of the band-gap energies was investigated. The significant changes in the phase and amplitude of the photoacoustic signal near the band-gap absorption wavelengths were observed to occur when the Si-doping densities in GaAs were varied. Particularly, the first derivatives of the photoacoustic phase vs. wavelength graphs were evaluated and fitted with single Gaussian functions. The peak centers and the widths of the Gaussian curves clearly showed linear relationships with the log values of the Si-doping densities in n-type GaAs semiconductors. It is proposed that the wavelength-dependent PA spectroscopy can be used as a simple and nondestructive method for measuring the doping densities in bulk semiconductors

Additional details

Publishing Information

Journal Title
Bulletin of the Korean Chemical Society
Journal Volume
35
Journal Issue
3
Series
30 refs, 5 figs, 2 tabs
Journal Page Range
p. 895-898
ISSN
0253-2964

INIS

Country of Publication
Korea, Republic of
Country of Input or Organization
Korea, Republic of
INIS RN
46042857
Subject category
S42: ENGINEERING;
Descriptors DEI
EVALUATION; NONDESTRUCTIVE TESTING; PHOTOACOUSTIC SPECTROSCOPY; SIGNALS; WAVELENGTHS
Descriptors DEC
MATERIALS TESTING; SPECTROSCOPY; TESTING