Published 2003
| Version v1
Journal article
X-ray luminescence properties of thin organic films
Creators
- 1. NSC 'Kharkov Institute of Physics and Technology', Kharkov (Ukraine)
- 2. Institute for Single Crystals NAS, Kharkov (Ukraine)
Description
The results of studies on the soft X-ray sensitivity of thin organic Langmuir-Blodgett (LB) films are presented. A linear behavior of the relationship between the integral luminescence (Δ λ = 380 - 400 nm) and the dose rate of X-ray irradiation in the range of 10-6 - 10-5 A/kg at the energy of 5 keV has been established. It is shown that the specific X-ray luminescence of the 0.5 μm LB film exceeds that one of the single-crystal Cs J (Tl) scintillator of 1 mm in thickness by two orders of magnitude. It is supposed that these films can be used for measurement of the plasma temperature
Additional details
Publishing Information
- Journal Title
- Problems of Atomic Science and Technology. Series: Plasma Physics
- Journal Issue
- no.1/9/
- Journal Page Range
- p. 173-174
- ISSN
- 1682-9344
INIS
- Country of Publication
- Ukraine
- Country of Input or Organization
- Ukraine
- INIS RN
- 35093932
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- DOSE-RESPONSE RELATIONSHIPS; GADOLINIUM IONS; LEAD IONS; LUMINESCENCE; ORGANIC POLYMERS; PHOSPHORS; PHYSICAL RADIATION EFFECTS; RADIOSENSITIVITY; THIN FILMS; X RADIATION
- Descriptors DEC
- CHARGED PARTICLES; ELECTROMAGNETIC RADIATION; EMISSION; FILMS; IONIZING RADIATIONS; IONS; ORGANIC COMPOUNDS; PHOTON EMISSION; POLYMERS; RADIATION EFFECTS; RADIATIONS