Published September 21, 1995 | Version v1
Journal article

Error analysis and correction in a beam profile monitor

Creators

  • 1. Fermilab, Batavia, IL (United States)

Description

An analysis of the accuracy and sources of error of transverse beam profile measurements made with an ion profile monitor in the Fermilab booster is presented. Two dimensional computer simulations are compared with experiment to determine the magnitude of the errors and a correction algorithm that uses beam size and charge as parameters is developed. (orig.)

Additional details

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
Journal Volume
364
Journal Issue
1
Journal Page Range
p. 19-26.
ISSN
0168-9002
CODEN
NIMAER