Surface nanostructure of a directionally solidified Ni-based superalloy DZ4 induced by high intensity pulsed ion beam irradiation
- 1. Key Laboratory of Materials Modification by Laser, Ion and Electron Beams, Dalian University of Technology, Ministry of Education, Dalian 116024 (China)
Description
A high intensity pulsed ion beam (HIPIB) was used to irradiate directionally solidified nickel-based superalloy DZ4 with the following parameters: ion content consisting of Cn+ (30 at.%) and H+(70 at.%), an accelerating voltage of 250 kV, a pulse duration of 70 ns, a beam current density of 100 A/cm2, irradiation times of 15. As revealed by SEM and TEM, the thermal effect was confined in a ∼1.3 μm thick surface zone, in which rapid melting and cooling occurred. A two-phase nanostructured layer of ∼10 nm thick was formed on the outmost surface. The component phases are the γ phase and the carbide with a particle size of ∼5-10 nm. The presence of dense dislocation networks was observed in depth in the substrate metal, for instance ∼20 μm away from the sample surface, which is caused by shock wave impact.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.apsusc.2012.04.172Additional details
Identifiers
- DOI
- 10.1016/j.apsusc.2012.04.172;
- PII
- S0169-4332(12)00838-0;
Publishing Information
- Journal Title
- Applied Surface Science
- Journal Volume
- 258
- Journal Issue
- 20
- Journal Page Range
- p. 8061-8064
- ISSN
- 0169-4332
- CODEN
- ASUSEE
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 44030919
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- BEAM CURRENTS; CARBIDES; COOLING; HYDROGEN IONS 1 PLUS; ION BEAMS; IRRADIATION; LAYERS; NANOSTRUCTURES; NICKEL; NICKEL ALLOYS; PARTICLE SIZE; PHYSICAL RADIATION EFFECTS; POLYCRYSTALS; SCANNING ELECTRON MICROSCOPY; SHOCK WAVES; SUBSTRATES; SURFACES; TRANSMISSION ELECTRON MICROSCOPY
- Descriptors DEC
- ALLOYS; BEAMS; CARBON COMPOUNDS; CATIONS; CHARGED PARTICLES; CRYSTALS; CURRENTS; ELECTRON MICROSCOPY; ELEMENTS; HYDROGEN IONS; IONS; METALS; MICROSCOPY; RADIATION EFFECTS; SIZE; TRANSITION ELEMENT ALLOYS; TRANSITION ELEMENTS
Optional Information
- Copyright
- Copyright (c) 2012 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.