Published February 18, 2008 | Version v1
Journal article Metadata-only

Electrode structures in diode-type cadmium telluride detectors: Field emission scanning electron microscopy and energy-dispersive x-ray microanalysis

Creators

  • 1. Japan Synchrotron Radiation Research Institute (JASRI), 1-1-1 Kouto, Sayo, Hyogo 679-5198 (Japan)
  • 2. National Institute for Materials Science (NIMS), 1-1-1 Kouto, Sayo, Hyogo 679-5148 (Japan)

Description

The structures of the interface regions between CdTe crystal and electrodes in diode-type CdTe x-ray detectors with a layout of In(anode)/CdTe/Pt(cathode) are reported. The structures have been investigated by field emission scanning electron microscopy and energy-dispersive x-ray microanalysis. The investigation has revealed that the structures are complicated. The anode-side interface is a contact between In1-xTex alloys and CdTe crystal. The cathode side is a structure of Pt/(Te-rich phase)/CdTe. These findings suggest that the complicated structures in the interface regions are a possible cause for the polarization phenomenon observed in the diode-type CdTe detectors

Additional details

Identifiers

DOI
10.1063/1.2825565;

Publishing Information

Journal Title
Applied Physics Letters
Journal Volume
92
Journal Issue
7
Journal Page Range
p. 073501-073501.3
ISSN
0003-6951
CODEN
APPLAB

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
39038569
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
ANODES; CADMIUM TELLURIDES; CATHODES; CDTE SEMICONDUCTOR DETECTORS; CHEMICAL ANALYSIS; CRYSTALS; FIELD EMISSION; INDIUM; INDIUM ALLOYS; INDIUM TELLURIDES; INTERFACES; MICROANALYSIS; PLATINUM; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTOR MATERIALS; TELLURIUM ALLOYS; X RADIATION; X-RAY DETECTION
Descriptors DEC
ALLOYS; CADMIUM COMPOUNDS; CHALCOGENIDES; DETECTION; ELECTRODES; ELECTROMAGNETIC RADIATION; ELECTRON MICROSCOPY; ELEMENTS; EMISSION; INDIUM COMPOUNDS; IONIZING RADIATIONS; MATERIALS; MEASURING INSTRUMENTS; METALS; MICROSCOPY; PLATINUM METALS; RADIATION DETECTION; RADIATION DETECTORS; RADIATIONS; SEMICONDUCTOR DETECTORS; TELLURIDES; TELLURIUM COMPOUNDS; TRANSITION ELEMENTS

Optional Information

Notes
(c) 2008 American Institute of Physics