Published October 2006 | Version v1
Journal article

Peak assignments of ELNES and XANES using overlap population diagrams

  • 1. National Center for Electron Microscopy, Lawrence Berkeley National Laboratory, One Cyclotron Road, MS 72-105, Berkeley, CA 94720 (United States) and Institute of Engineering Innovation, University of Tokyo, 2-11-16, Yayoi, Bunkyo, Tokyo 113-8656 (Japan)
  • 2. Department of Materials, Physics and Energy Engineering, Nagoya University, Chikusa, Nagoya 464-8603 (Japan)
  • 3. Department of Materials Science and Engineering, Kyoto University, Yoshida, Sakyo, Kyoto 606-8501 (Japan)

Description

The usefulness of overlap population (OP) diagrams for peak assignments of an electron energy loss near-edge structure (ELNES) and an X-ray absorption near-edge structure (XANES) is demonstrated. Mg-K, L2,3, and O-K edges of MgO are taken as examples. Theoretical calculations are performed using a first-principles orthogonalized linear combination of atomic orbitals (OLCAO) method. A core-hole is included explicitly, and a large supercell is used to minimize artificial interactions among the core-holes in adjacent cells. All experimental spectra are quantitatively reproduced by the calculations. The OP diagrams for a selected pair of atomic orbitals are computed in order to provide proper assignments for each peak in ELNES and XANES. They are interpreted in terms of interactions among Mg-Mg and Mg-O bonds. Results are found to be consistent to our previous conclusion, which was obtained using a cluster method [T. Mizoguchi, et al., Phys. Rev. B 61 (2000) 2180]. The powerful combination of the OP diagram and a high-energy resolution ELNES to obtain fine electronic structures is also demonstrated

Additional details

Identifiers

DOI
10.1016/j.ultramic.2006.04.027;
PII
S0304-3991(06)00113-6;

Publishing Information

Journal Title
Ultramicroscopy (Amsterdam)
Journal Volume
106
Journal Issue
11-12
Journal Page Range
p. 1120-1128
ISSN
0304-3991
CODEN
ULTRD6

Conference

Title
International workshop on enhanced data generated by electrons
Dates
1-5 May 2005
Place
Grundlsee (Austria)

Optional Information

Copyright
Copyright (c) 2006 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.