Published 1977 | Version v1
Report Open

Qualitative analysis of a powdered diamond sample by particle induced X-ray emission (PIXE)

Creators

  • 1. University of the Witwatersrand, Johannesburg (South Africa). Nuclear Physics Research Unit

Description

The main purpose of this analysis was to determine whether nickel is present in diamond powder as a trace element. Particle induced X-ray emission (PIXE) showed unambiguously that nickel was present. Due to the convenience of PIXE in multielemental analysis, the investigations also include a number of other trace elements in the sample

Availability note (English)

MF available from INIS under the Report Number.

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Additional details

Publishing Information

ISBN
0 85494 434 6
Imprint Pagination
8 p.
Report number
NPRU--77/1

INIS

Country of Publication
South Africa
Country of Input or Organization
South Africa
INIS RN
8342642
Subject category
S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
Descriptors DEI
DIAMONDS; ELEMENTS; IRRADIATION; MULTI-ELEMENT ANALYSIS; NICKEL; PROTON BEAMS; QUALITATIVE CHEMICAL ANALYSIS; RADIATION DETECTORS; TARGETS; X-RAY EMISSION ANALYSIS; X-RAY SPECTRA
Descriptors DEC
BEAMS; CARBON; CHEMICAL ANALYSIS; MEASURING INSTRUMENTS; METALS; MINERALS; NONDESTRUCTIVE ANALYSIS; NONMETALS; NUCLEON BEAMS; PARTICLE BEAMS; SPECTRA; TRANSITION ELEMENTS