Published April 1, 2017 | Version v1
Journal article

Soft x-ray photoemission spectroscopy of the Ba atomic layer deposition on the ceramic multiferroic BiFeO3

  • 1. Ioffe Institute, Politekhnicheskaya str. 26, St. Petersburg, 194021 (Russian Federation)
  • 2. St Petersburg Academic University, Khlopina str.8/3, St. Petersburg, 194021 (Russian Federation)
  • 3. Helmholts-Zentrum Berlin, Elektronenspeicherring BESSY II, Albert-Einstein-Strasse 15, D-12489 Berlin (Germany)

Description

Highlights: • Ba/BiFeO3 interface was studied by X-ray synchrotron- photoemission spectroscopy. • Ba adsorption is found to modify the Bi 4f, O 1s and Fe 2p core level spectra. • Ba induced charge transfer causes increasing in Bi-valency and O-ionicity. • Ba adsorption results in increasing the amount of Fe2+ ions in the surface region. - Abstract: Electronic structure of the ceramic multiferroic BiFeO3 and the Ba/BiFeO3 nanointerface is investigated in situ in an ultrahigh vacuum by synchrotron-based photoemission spectroscopy with the excited photon energy from 120 eV to 900 eV. The Bi 4f, O 1s, Fe 2p, and Ba 5p core-levels spectra are studied. The Ba atomic layer deposition is found to induce a significant change in spectra that is originated from the charge transfer between Ba adatoms and Bi, O surface atoms with increasing the Bi-valency and O-ionicity. The Fe 2p3/2 core level spectrum for the clean BiFeO3 is shown to contain both the Fe2+ and Fe3+ ion components with the atomic ratio of Fe2+/Fe3+ ∼1. The Ba adsorption is found to increase the ratio up to ∼1.5. This new effect is clearly caused by recharge between Fe3+ ↔ Fe2+ ions with increasing the amount of Fe2+ ions.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.apsusc.2016.12.185

Additional details

Identifiers

DOI
10.1016/j.apsusc.2016.12.185;
PII
S0169-4332(16)32916-6;

Publishing Information

Journal Title
Applied Surface Science
Journal Volume
400
Journal Page Range
p. 172-175
ISSN
0169-4332
CODEN
ASUSEE

Optional Information

Copyright
Copyright (c) 2016 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.