Thermal annealing dependence of the structural, optical and electrical properties of selenium-tellerium films
Description
Glassy substrates Se85Te15 thin films were thermally evaporated onto chemically cleaned glass. Optical absorption measurements were carried out on as-deposited and thermal annealed Se85Te15 films. It was found that the mechanism of the optical absorption follows the rule of non-direct transition. The annealed Se85Te15 films showed a decrease in the optical energy gap with increasing temperature of annealing higher than the glass transition temperature (343 K). The microstructure of the as-deposited and annealed Se85Te15 films was investigated. The crystalline phases, resulting from differential thermal analysis, have been confirmed using X-ray diffraction and transmission electron microscopy. The effect of annealing on the activation energy for conduction was also studied. The results are discussed on the basis of amorphous-crystalline transformations
Additional details
Identifiers
- DOI
- 10.1016/S0254-0584(03)00184-6;
- arXiv
- arXiv:hep-ph/0212259v2;
- PII
- S0254058403001846;
Publishing Information
- Journal Title
- Materials Chemistry and Physics
- Journal Volume
- 82
- Journal Issue
- 1
- Journal Page Range
- p. 101-106
- ISSN
- 0254-0584
- CODEN
- MCHPDR
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 38075630
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ACTIVATION ENERGY; ANNEALING; CRYSTALLIZATION; DIFFERENTIAL THERMAL ANALYSIS; ELECTRICAL PROPERTIES; ELECTRON MICROSCOPES; ENERGY GAP; GLASS; MICROSTRUCTURE; OPTICAL PROPERTIES; SELENIUM ALLOYS; TELLURIUM ALLOYS; TEMPERATURE RANGE 0273-0400 K; THIN FILMS; TRANSITION TEMPERATURE; TRANSMISSION ELECTRON MICROSCOPY; X-RAY DIFFRACTION
- Descriptors DEC
- ALLOYS; COHERENT SCATTERING; DIFFRACTION; ELECTRON MICROSCOPY; ENERGY; FILMS; HEAT TREATMENTS; MICROSCOPES; MICROSCOPY; PHASE TRANSFORMATIONS; PHYSICAL PROPERTIES; SCATTERING; TEMPERATURE RANGE; THERMAL ANALYSIS; THERMODYNAMIC PROPERTIES
Optional Information
- Copyright
- Copyright (c) 2003 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.