Published 2011
| Version v1
Journal article
Development of a Sampling ASIC for Fast Detector Signals
- 1. Laboratoire de l'Accelerateur Lineaire, Orsay (France)
- 2. Institute de Recherches pour les Sciences Fondamentales de l'Univers Saclay (France)
- 3. University of Chicago, Chicago, IL (United States)
- 4. University of Hawaii, Honolulu, HI (United States)
Description
In the context of the Large Area Picosecond Photodetector (LAPPD) project the motivation to measure time-of-flight at the picosecond resolution has pushed towards a faster signal rise-time (below 100 ps) and a higher bandwidth output (higher than 1 GHz) detector, thus, leading to a new signal development and integrity studies of Micro-Channel Plates (MCP) photo-detectors. Similarly, the signal path, is being simulated and characterized, from the anodes to the input of the readout electronics, to minimise losses. Furthermore, to acquire the detector fast pulses a new 10 Gs/s high input bandwidth, 130 nm CMOS sampling chip is being developed. (authors)
Availability note (English)
Also available at http://th-www.if.uj.edu.pl/acta/sup4/pdf/s4p0035.pdfAdditional details
Additional titles
- Augmented title (English)
- PACS numbers: 85.40.-e
Identifiers
Publishing Information
- Journal Title
- Acta Physica Polonica. Series B, Proceedings Supplement
- Journal Volume
- 4
- Journal Issue
- 1
- Journal Page Range
- p. 35-40
- ISSN
- 1899-2358
Conference
- Title
- Workshop on Timing Detectors
- Dates
- 29 Nov - 1 Dec 2010
- Place
- Cracow (Poland)
INIS
- Country of Publication
- Poland
- Country of Input or Organization
- Poland
- INIS RN
- 42076134
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ANALOG-TO-DIGITAL CONVERTERS; CATHODES; FREQUENCY RANGE; INTEGRATED CIRCUITS; MICROCHANNEL ELECTRON MULTIPLIERS; PULSES; SAMPLING; SIGNALS; TIMING PROPERTIES
- Descriptors DEC
- ELECTRODES; ELECTRON MULTIPLIERS; ELECTRON TUBES; ELECTRONIC CIRCUITS; ELECTRONIC EQUIPMENT; EQUIPMENT; MICROELECTRONIC CIRCUITS
Optional Information
- Notes
- 6 figs., 1 tab.