Published February 1983 | Version v1
Journal article Metadata-only

Angle resolved photoemission in semiconductors

Creators

  • 1. Laboratoire pour l'Utilisation du Rayonnement Electromagnetique (LURE), Paris-11 Univ., 91 - Orsay (France)

Description

Bases of angular resolved photoemission: determination of the electronic band structure of solids (bulk), measurements of life-time and mean free path, determination of surfaces states (valence and core) and their relationship with surface reconstruction are described. (Author)

Abstract (Portuguese)

Descrevem-se as bases da fotoemissao com angulo resolvido: determinacao da estrutura de banda eletronica de solidos (corpo), medidas do tempo de vida e do livre caminho medio, determinacao dos estados de superficies (valencia e caroco) e seu relacionamento com reconstrucao de superficies. (L.C.)

Additional details

Publishing Information

Journal Title
Rev. Bras. Fis.
Journal Volume
especial)
Series
Rev. Bras. Fis.
Journal Page Range
78-103
ISSN
0374-4922

Conference

Title
1. Brazilian School on Semiconductor Physics.
Dates
31 Jan - 11 Feb 1983.
Place
Campinas, SP (Brazil).

INIS

Country of Publication
Brazil
Country of Input or Organization
Brazil
INIS RN
16079012
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Resource subtype / Literary indicator
Conference, Numerical Data
Descriptors DEI
COMPILED DATA; ELECTRONIC STRUCTURE; EMISSION SPECTRA; EXPERIMENTAL DATA; LIFETIME; LINEAR MOMENTUM; MEAN FREE PATH; PHOTOEMISSION; SEMICONDUCTOR MATERIALS; SURFACES
Descriptors DEC
DATA; EMISSION; INFORMATION; MATERIALS; NUMERICAL DATA; SECONDARY EMISSION; SPECTRA