Published October 15, 2007 | Version v1
Journal article Metadata-only

Room temperature ferromagnetic (Zn,Co)O epitaxial films obtained by low-temperature MOCVD process

Creators

  • 1. R. 551, Coordination Chemistry Laboratory, Inorganic Chemistry Division, Department of Chemistry, Moscow State University, Leninskie Gory, Moscow 119992 (Russian Federation)
  • 2. Department of Physics, University of Konstanz, 78457 Konstanz (Germany)
  • 3. Institut fuer Festkoerperphysik, Technische Universitaet Dresden, 01062 Dresden (Germany)
  • 4. Department of Physics, Moscow State University, Moscow 119992 (Russian Federation)

Description

High quality epitaxial films of Zn1-xCoxO solid solutions were obtained by low-temperature MOCVD process using water vapor up to x = 0.33. Depositions were carried out at 300 deg. C on r-sapphire substrates. Films structure and composition were investigated by XRD, XPS and EDX measurements. Magnetic properties were examined using SQUID and Kerr effect measurements. All samples showed ferromagnetic behavior at room temperature. NEXAFS and PES were employed to investigate electronic structure of the films

Availability note (English)

Available from http://dx.doi.org/10.1016/j.tsf.2007.03.099

Additional details

Identifiers

DOI
10.1016/j.tsf.2007.03.099;
PII
S0040-6090(07)00428-2;

Publishing Information

Journal Title
Thin Solid Films
Journal Volume
515
Journal Issue
24
Journal Page Range
p. 8490-8494
ISSN
0040-6090
CODEN
THSFAP

Conference

Title
1. international symposium on transparent conducting oxides
Dates
23-26 Oct 2006
Place
Crete (Greece)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
39071017
Subject category
S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ABSORPTION SPECTROSCOPY; CHEMICAL VAPOR DEPOSITION; COBALT COMPOUNDS; DOPED MATERIALS; ELECTRONIC STRUCTURE; EPITAXY; FINE STRUCTURE; KERR EFFECT; MAGNETIC PROPERTIES; MAGNETIC SEMICONDUCTORS; SAPPHIRE; SOLID SOLUTIONS; SQUID DEVICES; TEMPERATURE RANGE 0273-0400 K; TEMPERATURE RANGE 0400-1000 K; THIN FILMS; WATER VAPOR; X-RAY DIFFRACTION; X-RAY PHOTOELECTRON SPECTROSCOPY; X-RAY SPECTROSCOPY; ZINC OXIDES
Descriptors DEC
CHALCOGENIDES; CHEMICAL COATING; COHERENT SCATTERING; CORUNDUM; CRYSTAL GROWTH METHODS; DEPOSITION; DIELECTRIC PROPERTIES; DIFFRACTION; DISPERSIONS; ELECTRICAL PROPERTIES; ELECTRON SPECTROSCOPY; ELECTRONIC EQUIPMENT; EQUIPMENT; FILMS; FLUIDS; FLUXMETERS; GASES; HOMOGENEOUS MIXTURES; MATERIALS; MEASURING INSTRUMENTS; MICROWAVE EQUIPMENT; MINERALS; MIXTURES; OXIDE MINERALS; OXIDES; OXYGEN COMPOUNDS; PHOTOELECTRON SPECTROSCOPY; PHYSICAL PROPERTIES; SCATTERING; SEMICONDUCTOR MATERIALS; SOLUTIONS; SPECTROSCOPY; SUPERCONDUCTING DEVICES; SURFACE COATING; TEMPERATURE RANGE; TRANSITION ELEMENT COMPOUNDS; VAPORS; ZINC COMPOUNDS

Optional Information

Copyright
Copyright (c) 2007 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.