Published 2012 | Version v1
Book

Low power, low noise, charge sensitive amplifier in CMOS 0.18 μm technology for the readout of fine pitch pixelated CdTe detector

  • 1. CEA Saclay, DSM/IRFU/Service d'Electronique, de Detecteurs et d'informatique, bat. 141, 91191 Gif-sur-Yvette (France)
  • 2. CEA Saclay, DSM/IRFU/Service d'Astrophysique, bat. 709 L'Orme des Merisiers, 91191 Gif-sur-Yvette (France)
  • 3. Lawrence Berkeley National Laboratory (United States)

Description

Our group is currently developing a new project dedicated to the design of new Cd(Zn)Te spectro-imaging systems for future space borne astrophysics missions. The main goal is to build a spectro-imaging system with matrix ASIC hybridized to pixelated Cd(Zn)Te detector with typical pixel of 300 μm pitch and typical energy resolution of 0.5 keV at 60 keV. Before designing a complete matrix of readout channels, we designed a prototype ASIC to evaluate the microelectronic technology in terms of noise and tolerance to radiation. We designed an ASIC in the standard AMS 0.18 μm CMOS technology dedicated to the readout of very low capacitance (≤1 pF) and very low dark current (≤5 pA) Cd(Zn)Te detectors. The Caterpylar AMS is a set of 30 low noise low power Charge Sensitive Amplifiers (CSAs). All the CSAs have the same folded cascade architecture, only the type (PMOS or NMOS) and the geometry of the input transistors differ between CSAs. The noise performances of the technology are very good since a minimal ENC of 9 e(-)rms has been measured with power consumption in the CSA of 12 μW only. Influence of the W/L ratio and W * L product of input transistor on noise has been measured and discussed. We connected one of the CSA to a silicon diode and measured an energy resolution of 580 eV FWHM at 122 keV with a 57Co source and of 470 eV FWHM at 59.5 keV with a 241Am source. (authors)

Availability note (English)

Available from doi: http://dx.doi.org/10.1109/NSSMIC.2012.6551224

Additional details

Identifiers

Publishing Information

Publisher
IEEE
Imprint Place
Piscataway, NJ (United States)
ISBN
978-1-4673-2028-3
Imprint Pagination
6 p.

Conference

Title
IEEE Nuclear Science Symposium - Medical Imaging Conference Record (NSS/MIC) - 19. Room-Temperature Semiconductor X-ray and Gamma-ray Detector Workshop
Dates
29 Oct - 3 Nov 2012
Place
Anaheim (Canada)

INIS

Country of Publication
United States
Country of Input or Organization
France
INIS RN
46072463
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ASTROPHYSICS; DESIGN; ENERGY RESOLUTION; INTEGRATED CIRCUITS; RADIATION DETECTORS; RADIATION EFFECTS; READOUT SYSTEMS
Descriptors DEC
ELECTRONIC CIRCUITS; MEASURING INSTRUMENTS; MICROELECTRONIC CIRCUITS; PHYSICS; RESOLUTION

Optional Information

Notes
7 refs.