Published January 15, 2003
| Version v1
Journal article
Prospects for imaging with TOF-SIMS using gold liquid metal ion sources
Creators
Description
Gold liquid metal ion sources produce high quality TOF-SIMS spectra with excellent prospects for imaging using either Au++, Au+ or Au2+ primary ions. The beam is stable and exhibits a long lifetime when employing eutectic alloys of Si or Ge. In general, the yields are found to be considerably higher than when using Ga beams, but the increased yield associated with using dimer ions is also associated with an increase in surface damage. Finally, it appears that Au++ ion bombardment may yield improved spectra for certain types of compounds
Additional details
Identifiers
- PII
- S0169433202006244;
Publishing Information
- Journal Title
- Applied Surface Science
- Journal Volume
- 203-204
- Journal Issue
- 1-4
- Journal Page Range
- p. 198-200
- ISSN
- 0169-4332
- CODEN
- ASUSEE
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 38069706
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- EUTECTICS; GERMANIUM ALLOYS; GOLD; GOLD IONS; ION BEAMS; ION MICROPROBE ANALYSIS; LIQUID METALS; MASS SPECTROSCOPY; SILICON ALLOYS; SPECTRA
- Descriptors DEC
- ALLOYS; BEAMS; CHARGED PARTICLES; CHEMICAL ANALYSIS; ELEMENTS; FLUIDS; IONS; LIQUIDS; METALS; MICROANALYSIS; NONDESTRUCTIVE ANALYSIS; SPECTROSCOPY; TRANSITION ELEMENTS
Optional Information
- Copyright
- Copyright (c) 2002 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.