Published March 21, 2001 | Version v1
Journal article

Capacitance of silicon pixels

Description

Capacitance measurements have been made on silicon pixel sensors of types n+ on n, p+on n, and n+ on p. The arrays test a variety of implant and gap widths, and the n+ on n devices test several p-stop designs. The measurements examine inter-pixel and backplane contributions and include studies of temperature dependence. Measurements were made before and after irradiation with fluences relevant to LHC experiments and Fermilab Tevatron Run 2

Additional details

Identifiers

PII
S0168900200010810;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
Journal Volume
460
Journal Issue
2-3
Journal Page Range
p. 336-351
ISSN
0168-9002
CODEN
NIMAER

Optional Information

Copyright
Copyright (c) 2001 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.