Published 2003 | Version v1
Miscellaneous

Characterization LixMn2O4 of thin films by XANES on the edges k of O and L2,3 of Mn

  • 1. Sergipe Univ., Aracaju, SE (Brazil). Dept. de Fisica. Lab. de Preparacao e Caracterizacao de Materiais
  • 2. Ceara Univ., Fortaleza, CE (Brazil). Dept. de Fisica

Description

no abstract available

Part of:
13. Annual meeting of the LNLS users - Abstracts

Additional details

Additional titles

Original title (Portuguese)
Caracterizacao de filmes finos Li

Publishing Information

Imprint Title
13. Annual meeting of the LNLS users - Abstracts
Imprint Pagination
265 p.
Journal Page Range
p. 138

Conference

Title
13. Annual meeting of the LNLS users
Original Conference Title
13. Reuniao anual de usuarios do LNLS
Dates
17-18 Feb 2003
Place
Campinas, SP (Brazil)

INIS

Country of Publication
Brazil
Country of Input or Organization
Brazil
INIS RN
34080282
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Resource subtype / Literary indicator
No Abstract, Conference, Non-conventional Literature
Descriptors DEI
ABSORPTION SPECTROSCOPY; LAYERS; LITHIUM; MANGANESE; OXYGEN; SPINELS; THIN FILMS; X-RAY SPECTROSCOPY
Descriptors DEC
ALKALI METALS; ELEMENTS; FILMS; METALS; MINERALS; NONMETALS; OXIDE MINERALS; SPECTROSCOPY; TRANSITION ELEMENTS

Optional Information

Notes
3 refs. Imprint:13. Reuniao anual de usuarios do LNLS - Resumos