Published 2003
| Version v1
Miscellaneous
Characterization LixMn2O4 of thin films by XANES on the edges k of O and L2,3 of Mn
- 1. Sergipe Univ., Aracaju, SE (Brazil). Dept. de Fisica. Lab. de Preparacao e Caracterizacao de Materiais
- 2. Ceara Univ., Fortaleza, CE (Brazil). Dept. de Fisica
Description
no abstract available
Additional details
Additional titles
- Original title (Portuguese)
- Caracterizacao de filmes finos Li
Publishing Information
- Imprint Title
- 13. Annual meeting of the LNLS users - Abstracts
- Imprint Pagination
- 265 p.
- Journal Page Range
- p. 138
Conference
- Title
- 13. Annual meeting of the LNLS users
- Original Conference Title
- 13. Reuniao anual de usuarios do LNLS
- Dates
- 17-18 Feb 2003
- Place
- Campinas, SP (Brazil)
INIS
- Country of Publication
- Brazil
- Country of Input or Organization
- Brazil
- INIS RN
- 34080282
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- No Abstract, Conference, Non-conventional Literature
- Descriptors DEI
- ABSORPTION SPECTROSCOPY; LAYERS; LITHIUM; MANGANESE; OXYGEN; SPINELS; THIN FILMS; X-RAY SPECTROSCOPY
- Descriptors DEC
- ALKALI METALS; ELEMENTS; FILMS; METALS; MINERALS; NONMETALS; OXIDE MINERALS; SPECTROSCOPY; TRANSITION ELEMENTS
Optional Information
- Notes
- 3 refs. Imprint:13. Reuniao anual de usuarios do LNLS - Resumos