Published February 2014
| Version v1
Journal article
Optical system for microscopic observation and strain measurement at high temperature
Creators
- 1. Research Center for Advanced Science and Technology, The University of Tokyo, 4-6-1 Komaba, Meguro-ku, Tokyo 153-8904 (Japan)
Description
A system of optical microscopy has been developed for high-temperature direct observation and strain measurement. Observations at high temperatures are carried out using a UV CCD camera and UV illumination while thermal radiation is cut off by a UV light transmission filter. Observation of a Vickers indentation on polycrystalline α-Al2O3 revealed that sufficient image contrast was maintained up to 1400 °C. The potential of the proposed system for strain measurement via digital image correlation was evaluated through measuring the thermal strain of polycrystalline α-Al2O3; the obtained coefficient of thermal expansion agreed well with the reported values. (paper)
Availability note (English)
Available from http://dx.doi.org/10.1088/0957-0233/25/2/025002Additional details
Identifiers
Publishing Information
- Journal Title
- Measurement Science and Technology
- Journal Volume
- 25
- Journal Issue
- 2
- Journal Page Range
- [9 p.]
- ISSN
- 0957-0233
- CODEN
- MSTCEP
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 46067764
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- ALUMINIUM OXIDES; CHARGE-COUPLED DEVICES; ILLUMINANCE; IMAGES; OPTICAL MICROSCOPY; OPTICAL SYSTEMS; POLYCRYSTALS; STRAINS; THERMAL EXPANSION; THERMAL RADIATION; ULTRAVIOLET RADIATION
- Descriptors DEC
- ALUMINIUM COMPOUNDS; CHALCOGENIDES; CRYSTALS; ELECTROMAGNETIC RADIATION; EXPANSION; MICROSCOPY; OXIDES; OXYGEN COMPOUNDS; RADIATIONS; SEMICONDUCTOR DEVICES