Published December 1999 | Version v1
Miscellaneous Metadata-only

Effects of two-frequency heating in the NIRS-HEC ECR ion source

Creators

  • 1. National Inst. of Radiological Sciences, Chiba, Chiba (Japan)
  • 2. Accelerator Engineering Corp., Chiba, Chiba (Japan)
  • 3. Tokyo Inst. of Technology, Tokyo (Japan)

Description

In order to investigate the effects of two-frequency heating, an additional microwave-injection system with a wide frequency range of 10 to 18 GHz was developed. The system consists of a synthesizer, a TWT amplifier and wave-guide components. The maximum power is about 250 W. From the measurement of VSWR, the total reflection power of the system is less than 3% between 10 and 18 GHz. In addition, the feedback loop with the power monitor stabilizes the forward power in all frequency range. The intensities of Ar and Xe ions have been measured at various additional frequencies between 10 and 18 GHz with main frequency of 18 GHz. The output currents were improved to 70 and 65 eμA for 132Xe20+ and 132Xe21+ from gasses with natural abundance, respectively. We also found a very fine structure, when we changed the frequency. However the explanation has not yet been obtained. The phenomenon still seems complex. The investigation is now in progress. (author)

Part of:
Proceedings of the second symposium on accelerator and related technology for application

Additional details

Publishing Information

Imprint Title
Proceedings of the second symposium on accelerator and related technology for application
Imprint Pagination
129 p.
Journal Page Range
p. 41-44

Conference

Title
2. symposium on accelerator and related technology for application
Acronym
ARTA 1999
Dates
1-3 Dec 1999
Place
Tokyo (Japan)

INIS

Country of Publication
Japan
Country of Input or Organization
Japan
INIS RN
41041968
Subject category
S43: PARTICLE ACCELERATORS; S70: PLASMA PHYSICS AND FUSION TECHNOLOGY;
Resource subtype / Literary indicator
Conference, Non-conventional Literature
Descriptors DEI
BEAM CURRENTS; BEAM EXTRACTION; ECR ION SOURCES; FREQUENCY ANALYSIS; FREQUENCY DEPENDENCE; FREQUENCY MIXING; HIMAC ACCELERATOR; MAGNETIC CONFINEMENT; MICROWAVE EQUIPMENT; MICROWAVE RADIATION; MULTICHARGED IONS; PERFORMANCE TESTING; PLASMA HEATING
Descriptors DEC
ACCELERATORS; CHARGED PARTICLES; CONFINEMENT; CURRENTS; CYCLIC ACCELERATORS; ELECTROMAGNETIC RADIATION; ELECTRONIC EQUIPMENT; EQUIPMENT; HEATING; HEAVY ION ACCELERATORS; ION SOURCES; IONS; PLASMA CONFINEMENT; RADIATIONS; SYNCHROTRONS; TESTING

Optional Information

Notes
6 refs., 5 figs.