Driven dynamics of simplified tribological models
Creators
- 1. CNR-INFM National Research Center S3 and Department of Physics, University of Modena and Reggio Emilia, Via Campi 213/A, 41100 Modena (Italy)
- 2. Institute of Physics, National Academy of Sciences of Ukraine, 03028 Kiev (Ukraine)
Description
Over the last decade, remarkable developments in nanotechnology, notably the use of atomic and friction force microscopes (AFM/FFM), the surface-force apparatus (SFA) and the quartz-crystal microbalance (QCM), have provided the possibility to build experimental devices able to perform analysis on well-characterized materials at the nano- and microscale. Simultaneously, tremendous advances in computing hardware and methodology (molecular dynamics techniques and ab initio calculations) have dramatically increased the ability of theoreticians to simulate tribological processes, supplying very detailed information on the atomic scale for realistic sliding systems. This acceleration in experiments and computations, leading often to very detailed yet complex data, has deeply stimulated the search, rediscovery and implementation of simpler mathematical models such as the generalized Frenkel-Kontorova and Tomlinson models, capable of describing and interpreting, in a more immediate way, the essential physics involved in nonlinear sliding phenomena
Additional details
Identifiers
- DOI
- 10.1088/0953-8984/19/30/305017;
- PII
- S0953-8984(07)43458-0;
Publishing Information
- Journal Title
- Journal of Physics. Condensed Matter
- Journal Volume
- 19
- Journal Issue
- 30
- Journal Page Range
- p. 305017
- ISSN
- 0953-8984
- CODEN
- JCOMEL
Conference
- Title
- 12. workshop on surface dynamics
- Dates
- 22-25 Jun 2006
- Place
- Modena (Italy)
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 39043930
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ATOMIC FORCE MICROSCOPY; CRYSTALS; FRICTION; MATHEMATICAL MODELS; MICROBALANCES; MOLECULAR DYNAMICS METHOD; NANOSTRUCTURES; NONLINEAR PROBLEMS; QUARTZ; SURFACE FORCES
- Descriptors DEC
- BALANCES; CALCULATION METHODS; MEASURING INSTRUMENTS; MICROSCOPY; MINERALS; OXIDE MINERALS; WEIGHT INDICATORS