Consideration of the neutron image intensifier camera
Creators
- 1. Hokkaido University, Sapporo, Hokkaido (Japan)
- 2. Toshiba Nuclear Engineering Services Corp., Yokohama, Kanagawa (Japan)
Description
Several detectors have been developed for neutron transmission imaging, but neutron image intensifer (NII) is also an option in terms of field of view and sensitivity. Since NII has a position resolution of less than 0.1 mm, it can be expected to obtain a high-sensitivity, high-gradation fine image with a camera to be combined. In this research, we selected CMOS cameras for industrial applications with linearity in sensitivity as the camera, and examined the performance evaluation of the camera, especially the cooling effect of the sensor which becomes a problem in long time measurement. Based on this result, we developed a portable imaging system that compactly integrates a cooled camera with NII and camera and constructed a system that can be used instantaneously in various facilities. (author)
Additional details
Additional titles
- Original title (Japanese)
- 中性子イメージインテンシファイア撮像カメラの検討
Publishing Information
- Journal Title
- Hamon (Online)
- Journal Volume
- 28
- Journal Issue
- 2
- Series
- 雑誌名:波紋
- Journal Page Range
- p. 77-83
- ISSN
- 1884-636X
INIS
- Country of Publication
- Japan
- Country of Input or Organization
- Japan
- INIS RN
- 49083132
- Subject category
- S07: ISOTOPES AND RADIATION SOURCES; S43: PARTICLE ACCELERATORS;
- Descriptors DEI
- BRIGHTNESS; CHARGE-COUPLED DEVICES; CMOS CIRCUITS; COOLING SYSTEMS; DARK CURRENT; IMAGES; LINEAR ACCELERATORS; NEUTRON CAMERAS; NEUTRON DETECTORS; NEUTRON FLUX; NEUTRON SOURCES; SHIELDING; TEMPERATURE DEPENDENCE; THERMAL CONDUCTION; TIME DEPENDENCE
- Descriptors DEC
- ACCELERATORS; CAMERAS; CURRENTS; ELECTRIC CURRENTS; ELECTRONIC CIRCUITS; ENERGY SYSTEMS; ENERGY TRANSFER; HEAT TRANSFER; INTEGRATED CIRCUITS; LEAKAGE CURRENT; MEASURING INSTRUMENTS; MICROELECTRONIC CIRCUITS; OPTICAL PROPERTIES; PARTICLE SOURCES; PHYSICAL PROPERTIES; RADIATION DETECTORS; RADIATION FLUX; RADIATION SOURCES; SEMICONDUCTOR DEVICES
Optional Information
- Notes
- 6 refs., 18 figs.