Published August 1, 2017
| Version v1
Journal article
Design and Implementation of Hybrid Multiple Valued Logic Error Detector using Single Electron Transistor and CMOS at 120 nm Technology
Creators
- 1. Department of Electronics and Telecommunication Engineering GHRCEM, Pune (India)
- 2. Department of Electronics Y.C.C.E, Nagpur (India)
Description
Hybridization of single electron transistor with MOSFET using quaternary logic for the design of Down Literal circuits are introduced here due to which the number of components as well as interconnection complexity will gets reduced just by designing the proper values of components of individual SET such as capacitor and resistors and by changing the values of W/L ratio of MOSFETS. This DLC's are used for the design of hybrid quaternary logic error detector and verified by CADENCE Tool. (paper)
Availability note (English)
Available from http://dx.doi.org/10.1088/1757-899X/225/1/012160Additional details
Identifiers
Publishing Information
- Journal Title
- IOP Conference Series. Materials Science and Engineering (Online)
- Journal Volume
- 225
- Journal Issue
- 1
- Journal Page Range
- [8 p.]
- ISSN
- 1757-899X
Conference
- Title
- International conference on materials, alloys and experimental mechanics
- Acronym
- ICMAEM-2017
- Dates
- 3-4 Jul 2017
- Place
- Hyderabad (India)
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 49091017
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CAPACITORS; DESIGN; ELECTRONS; ERRORS; MOSFET; RESISTORS; SEMICONDUCTOR MATERIALS
- Descriptors DEC
- ELECTRICAL EQUIPMENT; ELEMENTARY PARTICLES; EQUIPMENT; FERMIONS; FIELD EFFECT TRANSISTORS; LEPTONS; MATERIALS; MOS TRANSISTORS; SEMICONDUCTOR DEVICES; TRANSISTORS