Published August 1, 2017 | Version v1
Journal article

Design and Implementation of Hybrid Multiple Valued Logic Error Detector using Single Electron Transistor and CMOS at 120 nm Technology

  • 1. Department of Electronics and Telecommunication Engineering GHRCEM, Pune (India)
  • 2. Department of Electronics Y.C.C.E, Nagpur (India)

Description

Hybridization of single electron transistor with MOSFET using quaternary logic for the design of Down Literal circuits are introduced here due to which the number of components as well as interconnection complexity will gets reduced just by designing the proper values of components of individual SET such as capacitor and resistors and by changing the values of W/L ratio of MOSFETS. This DLC's are used for the design of hybrid quaternary logic error detector and verified by CADENCE Tool. (paper)

Availability note (English)

Available from http://dx.doi.org/10.1088/1757-899X/225/1/012160

Additional details

Publishing Information

Journal Title
IOP Conference Series. Materials Science and Engineering (Online)
Journal Volume
225
Journal Issue
1
Journal Page Range
[8 p.]
ISSN
1757-899X

Conference

Title
International conference on materials, alloys and experimental mechanics
Acronym
ICMAEM-2017
Dates
3-4 Jul 2017
Place
Hyderabad (India)

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
49091017
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
CAPACITORS; DESIGN; ELECTRONS; ERRORS; MOSFET; RESISTORS; SEMICONDUCTOR MATERIALS
Descriptors DEC
ELECTRICAL EQUIPMENT; ELEMENTARY PARTICLES; EQUIPMENT; FERMIONS; FIELD EFFECT TRANSISTORS; LEPTONS; MATERIALS; MOS TRANSISTORS; SEMICONDUCTOR DEVICES; TRANSISTORS