Published March 1980
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Electron temperature measurement of a plasma from X ray by absorber method
Description
We investigate the influence of the impurity content, of the shape of the radial density and temperature profiles and of the absorber thickness on the following measurements: X-ray spectra, effective measured power and electron temperature inferred from the absorber method. A bibliography documenting the theoretical formulae used for that problem is presented in the addenda
Availability note (English)
MF available from INIS under the Report Number.Abstract (French)
On etudie l'influence des impuretes, de la forme des profils radiaux de densite et de temperature, et de l'epaisseur des absorbants, sur les spectres de rayonnement X, sur les puissances mesurees et sur la mesure de la temperature electronique par la technique des absorbants. Dans les annexes, une etude bibliographique precise les differentes expressions theoriques utilisees pour traiter le problemeFiles
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Additional details
Additional titles
- Original title (French)
- Mesure de la temperature electronique d'un plasma, a partir du rayonnement X, par la technique des absorbants
Publishing Information
- Imprint Pagination
- 66 p.
- Report number
- EUR-CEA-FC--1038
INIS
- Country of Publication
- France
- Country of Input or Organization
- France
- INIS RN
- 11542479
- Subject category
- S70: PLASMA PHYSICS AND FUSION TECHNOLOGY;
- Resource subtype / Literary indicator
- Numerical Data
- Descriptors DEI
- ELECTRON TEMPERATURE; EXPERIMENTAL DATA; GRAPHS; IMPURITIES; PLASMA DIAGNOSTICS; REVIEWS; TEMPERATURE MEASUREMENT; X-RAY SPECTRA
- Descriptors DEC
- DATA; DATA FORMS; DOCUMENT TYPES; INFORMATION; NUMERICAL DATA; SPECTRA