Published July 18, 2016
| Version v1
Journal article
Effect of Mo insertion layers on the magnetoresistance and perpendicular magnetic anisotropy in Ta/CoFeB/MgO junctions
- 1. Department of Physics, University of Arizona, Tucson, Arizona 85721 (United States)
Description
The effect of a thin Mo dusting layer inserted at the interface of Ta/CoFeB of perpendicular magnetic tunneling junction with MgO barriers was investigated. Unlike thick Mo layers that exhibited a strong (110) crystalline texture, the inserted Mo layer between Ta/CoFeB had little negative influence on the crystallization of CoFe (001), therefore combining the advantages of Mo as a good thermal barrier and Ta as a good boron sink. For optimized Mo dusting thickness, a large tunneling magnetoresistance of 208% was achieved in perpendicular magnetic tunneling junctions with superior thermal stability at 500 °C.
Additional details
Identifiers
- DOI
- 10.1063/1.4958732;
Publishing Information
- Journal Title
- Applied Physics Letters
- Journal Volume
- 109
- Journal Issue
- 3
- Journal Page Range
- vp.
- ISSN
- 0003-6951
- CODEN
- APPLAB
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 48039085
- Subject category
- S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- ANISOTROPY; BORON; COBALT BORIDES; CONNECTORS; CRYSTALLIZATION; INTERFACES; IRON BORIDES; JOINTS; LAYERS; MAGNESIUM OXIDES; MAGNETORESISTANCE; MOLYBDENUM; TANTALUM; THICKNESS; TUNNEL EFFECT
- Descriptors DEC
- ALKALINE EARTH METAL COMPOUNDS; BORIDES; BORON COMPOUNDS; CHALCOGENIDES; COBALT COMPOUNDS; CONDUCTOR DEVICES; DIMENSIONS; ELECTRIC CONDUCTIVITY; ELECTRICAL EQUIPMENT; ELECTRICAL PROPERTIES; ELEMENTS; EQUIPMENT; IRON COMPOUNDS; MAGNESIUM COMPOUNDS; METALS; OXIDES; OXYGEN COMPOUNDS; PHASE TRANSFORMATIONS; PHYSICAL PROPERTIES; REFRACTORY METALS; SEMIMETALS; TRANSITION ELEMENT COMPOUNDS; TRANSITION ELEMENTS
Optional Information
- Notes
- (c) 2016 Author(s)