Wavelength dependence of transient photovoltage polarity
- 1. Key Laboratory of Luminescence and Optical Information, Ministry of Education, Institute of Optoelectronic Technology, Beijing Jiaotong University, Beijing 100044 (China)
Description
Using pulsed laser with different wavelengths, transient photovoltage (TPV) is investigated for the sandwich device of indium tin oxide (ITO)/poly (2-methoxy-5-(2'-ethylhexyloxy)-1, 4-phenylenevinylene) (MEH-PPV) (500 nm)/Al. At laser wavelength of 500 nm, a 0.1 millisecond negative TPV signal appears followed by a positive one lasting 40-80 milliseconds. With increasing laser wavelength, the negative signal becomes weak and disappears when wavelengths λ≥560 nm. This work demonstrates the process of exciton dissociation at the interface between ITO and MEH-PPV. A new method measuring the relative dissociation rate at the interface between polymer and electrode is introduced. It is estimated that the dissociation rate at Al interface is 4-8 times of that at the ITO interface
Availability note (English)
Available from http://dx.doi.org/10.1016/j.physleta.2008.07.024Additional details
Identifiers
- DOI
- 10.1016/j.physleta.2008.07.024;
- PII
- S0375-9601(08)01088-8;
Publishing Information
- Journal Title
- Physics Letters. A
- Journal Volume
- 372
- Journal Issue
- 36
- Journal Page Range
- p. 5853-5856
- ISSN
- 0375-9601
- CODEN
- PYLAAG
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 40049724
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- ALUMINIUM; DISSOCIATION; ELECTRODES; EQUIPMENT; EXCITONS; FREQUENCY DEPENDENCE; INDIUM OXIDES; INTERFACES; LASER RADIATION; PHOTOVOLTAIC EFFECT; POLYMERS; TIN OXIDES; TRANSIENTS; WAVELENGTHS
- Descriptors DEC
- CHALCOGENIDES; ELECTROMAGNETIC RADIATION; ELEMENTS; INDIUM COMPOUNDS; METALS; OXIDES; OXYGEN COMPOUNDS; PHOTOELECTRIC EFFECT; QUASI PARTICLES; RADIATIONS; TIN COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2008 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.