Room temperature synthesis of In2S3 micro- and nanorod textured thin films
- 1. Department of Materials Science, Indian Association for the Cultivation of Science, Kolkata 700032 (India)
Description
Thin films of indium sulfide (In2S3) micro- and nanorods were successfully prepared by sulfurization of electrodeposited metal indium layers. The films were characterized by X-ray diffraction (XRD), scanning electron microscope (SEM), transmission electron microscope (TEM) and UV-vis spectroscopy. From XRD and TEM observations it was concluded that the In2S3 nanorods and microrods have ∼50 nm and ∼0.5 μm diameter, respectively. A plausible top-growth mechanism was proposed for the formation of the nanorods in which the hydroxide layer was found to play an important role. The micro- and nanorods showed optical bandgap of ∼2.2 and ∼2.54 eV, respectively. This facile and cost effective method may be extended to fabricate other metal chalcogenide nanostructures on solid substrates
Availability note (English)
Available from http://dx.doi.org/10.1016/j.materresbull.2007.04.026Additional details
Identifiers
- DOI
- 10.1016/j.materresbull.2007.04.026;
- PII
- S0025-5408(07)00179-1;
Publishing Information
- Journal Title
- Materials Research Bulletin
- Journal Volume
- 43
- Journal Issue
- 4
- Journal Page Range
- p. 983-989
- ISSN
- 0025-5408
- CODEN
- MRBUAC
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 39082324
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ELECTRODEPOSITION; EV RANGE 01-10; HYDROXIDES; INDIUM SULFIDES; MICROSTRUCTURE; NANOSTRUCTURES; OPTICAL PROPERTIES; SCANNING ELECTRON MICROSCOPY; SPECTROSCOPY; SYNTHESIS; TEMPERATURE RANGE 0273-0400 K; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY; X-RAY DIFFRACTION
- Descriptors DEC
- CHALCOGENIDES; COHERENT SCATTERING; DEPOSITION; DIFFRACTION; ELECTROLYSIS; ELECTRON MICROSCOPY; ENERGY RANGE; EV RANGE; FILMS; HYDROGEN COMPOUNDS; INDIUM COMPOUNDS; LYSIS; MICROSCOPY; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; SCATTERING; SULFIDES; SULFUR COMPOUNDS; SURFACE COATING; TEMPERATURE RANGE
Optional Information
- Copyright
- Copyright (c) 2007 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.