Published February 15, 2005
| Version v1
Journal article
Current-induced chain migration in semiconductor polymer blends
Creators
- 1. ISIS, Rutherford Appleton Laboratory, Chilton, Didcot OX11 0QX (United Kingdom)
- 2. H.C. Starck GmbH, Werk Leverkusen, D-51368 Leverkusen (Germany)
- 3. CDT Limited, Madingley Road, Cambridge CB3 0TX (United Kingdom)
- 4. Department of Physics and Astronomy, University of Sheffield, Hounsfield Road, Sheffield S3 7RH (United Kingdom)
Description
We have used the technique of neutron reflectometry in order to evaluate the changes that occur within polymer light-emitting devices as they are operated. The devices examined consisted of an indium-tin-oxide, anode, a deuterated-poly(styrene sulfonate)/poly(3,4 ethylenedioxythiophene) (d-PSS/PEDT), charge injection layer, poly(fluorene) (F8), and a low work-function cathode. We found clear evidence for segregation of d-PSS to the d-PSS:PEDT/F8 interface in a device driven until its brightness had fallen to 10% of its initial value. We suggest that this effect is due to Joule heating of the device during operation
Additional details
Identifiers
Publishing Information
- Journal Title
- Physical Review. B, Condensed Matter and Materials Physics
- Journal Volume
- 71
- Journal Issue
- 8
- Journal Page Range
- p. 081308-081308.4
- ISSN
- 1098-0121
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 36103043
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- ANODES; INDIUM COMPOUNDS; JOULE HEATING; LAYERS; LIGHT EMITTING DIODES; NEUTRONS; ORGANIC SEMICONDUCTORS; POLYMERS; SEGREGATION; TIN OXIDES; WORK FUNCTIONS
- Descriptors DEC
- BARYONS; CHALCOGENIDES; ELECTRIC HEATING; ELECTRODES; ELEMENTARY PARTICLES; FERMIONS; FUNCTIONS; HADRONS; HEATING; MATERIALS; NUCLEONS; OXIDES; OXYGEN COMPOUNDS; PLASMA HEATING; SEMICONDUCTOR DEVICES; SEMICONDUCTOR DIODES; SEMICONDUCTOR MATERIALS; TIN COMPOUNDS
Optional Information
- Notes
- (c) 2005 The American Physical Society