Surface and wettability property analysis of CCF300 carbon fibers with different sizing or without sizing
Creators
- 1. School of Materials Science and Engineering, Beihang University, Beijing 100191 (China)
Description
To analyze the role of sizing on carbon fibers and the mechanism of adhesion in CF/polymer matrix composites, scanning electronic microscopy (SEM), atomic force microscopy (AFM), X-ray photoelectron spectroscopy (XPS), and dynamic contact angle analysis (DCAA) were selected to characterize the different properties between two types of sizings on carbon fiber CCF300. The results of surface roughness obtained from SEM and AFM images showed that the sizings smooth the surface of CCF300. In addition, the percentage of surface polar functional groups on sized CCF300 decreased slightly after sizing. In another hand, the total surface energy and the polar component of surface energy of the sized CCF300 decreased slightly compared to the unsized CCF300, and the J4 sizing has the more influence.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.matdes.2010.08.004Additional details
Identifiers
- DOI
- 10.1016/j.matdes.2010.08.004;
- PII
- S0261-3069(10)00479-6;
Publishing Information
- Journal Title
- Materials and Design
- Journal Volume
- 32
- Journal Issue
- 2
- Journal Page Range
- p. 941-946
- ISSN
- 0261-3069
- CODEN
- MADSD2
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 45018017
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ATOMIC FORCE MICROSCOPY; CARBON FIBERS; POLYMERS; SCANNING ELECTRON MICROSCOPY; SURFACE ENERGY; SURFACES; X-RAY PHOTOELECTRON SPECTROSCOPY
- Descriptors DEC
- ELECTRON MICROSCOPY; ELECTRON SPECTROSCOPY; ENERGY; FIBERS; FREE ENERGY; MICROSCOPY; PHOTOELECTRON SPECTROSCOPY; PHYSICAL PROPERTIES; SPECTROSCOPY; SURFACE PROPERTIES; THERMODYNAMIC PROPERTIES
Optional Information
- Copyright
- Copyright (c) 2010 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.