Published May 1, 1985
| Version v1
Journal article
Grazing incidence echelle spectrometers using varied line-space gratings
Description
Quantitative estimates are provided of the imaging performance expected from a varied line-space echelle spectrometer
Additional details
Publishing Information
- Journal Title
- Appl. Opt.
- Journal Volume
- 24
- Journal Issue
- 9
- Series
- Appl. Opt.
- Journal Page Range
- 1251-1255
- ISSN
- 0003-6935
- CODEN
- APOPA
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 17003784
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S70: PLASMA PHYSICS AND FUSION TECHNOLOGY;
- Descriptors DEI
- DIAGRAMS; DIFFRACTION GRATINGS; EFFICIENCY; INCIDENCE ANGLE; NOISE; PERFORMANCE; PLASMA DIAGNOSTICS; SOFT X RADIATION; SPECIFICATIONS; X-RAY SPECTROMETERS
- Descriptors DEC
- ELECTROMAGNETIC RADIATION; INFORMATION; IONIZING RADIATIONS; MEASURING INSTRUMENTS; RADIATIONS; SPECTROMETERS; X RADIATION