Published December 1979
| Version v1
Journal article
A curved crystal spectrometer for pionic X-ray measurements
Creators
- 1. Leningrad Nuclear Physics Institute, Gatchina, USSR
- 2. Eidgenoessische Technische Hochschule, Zurich (Switzerland). Lab. fuer Hochenergiephysik
- 3. Schweizerisches Inst. fuer Nuklearforschung, Villigen
Description
It has been demonstrated that it is possible to measure X-rays from pionic atoms directly at the pion production target. As compared to classical systems where the pions are first transported through a pion channel from the production target to a secondary target the gain is about two orders of magnitude in intensity. At the pion channel at SIN the construction is in progress of a bent-crystal spectrometer that will also measure X-rays from pionic atoms produced in the pion production target. (Auth.)
Additional details
Publishing Information
- Journal Title
- SIN Newsl.
- Journal Issue
- no.12
- Series
- SIN Newsl.
INIS
- Country of Publication
- Switzerland
- Country of Input or Organization
- Switzerland
- INIS RN
- 11559912
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- ACCURACY; CRYSTALS; ON-LINE MEASUREMENT SYSTEMS; PIONIC ATOMS; SPECIFICATIONS; X RADIATION; X-RAY SPECTROMETERS
- Descriptors DEC
- ATOMS; ELECTROMAGNETIC RADIATION; HADRONIC ATOMS; IONIZING RADIATIONS; MEASURING INSTRUMENTS; MESIC ATOMS; ON-LINE SYSTEMS; RADIATIONS; SPECTROMETERS