Published August 2010 | Version v1
Journal article

Overview of the Shanghai EBIT

  • 1. Applied Ion Beam Physics Laboratory, Fudan University, Key Laboratory of the Ministry of Education (China)

Description

EBIT (Electron Beam Ion Trap) is an excellent instrument both as light source and ion source, and is widely used in atomic physics research. In principle EBITs can produce ions of any charge state and of any element. In this report, a general introduction to the Shangai EBIT and short discussions of the spectroscopy platform are presented. Due to the repetitious running of the Shanghai EBIT over the past 5 years, it became necessary for the Shanghai EBIT to be disassembled for some maintenances and further modifications/improvements. The new design contains two major improvements. Furthermore, some experimental results on studies of dielectronic recombination processes for highly charged Xe ions will be discussed.

Availability note (English)

Available from http://dx.doi.org/10.1088/1748-0221/5/08/C08011

Additional details

Publishing Information

Journal Title
Journal of Instrumentation
Journal Volume
5
Journal Issue
08
Journal Page Range
p. C08011
ISSN
1748-0221

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
42025195
Subject category
S43: PARTICLE ACCELERATORS;
Descriptors DEI
ATOMIC PHYSICS; ELECTRON BEAMS; ION SOURCES; LIGHT SOURCES; MAINTENANCE; SPECTROSCOPY; TRAPS; XENON IONS
Descriptors DEC
BEAMS; CHARGED PARTICLES; IONS; LEPTON BEAMS; PARTICLE BEAMS; PHYSICS; RADIATION SOURCES