Published August 2010
| Version v1
Journal article
Overview of the Shanghai EBIT
Description
EBIT (Electron Beam Ion Trap) is an excellent instrument both as light source and ion source, and is widely used in atomic physics research. In principle EBITs can produce ions of any charge state and of any element. In this report, a general introduction to the Shangai EBIT and short discussions of the spectroscopy platform are presented. Due to the repetitious running of the Shanghai EBIT over the past 5 years, it became necessary for the Shanghai EBIT to be disassembled for some maintenances and further modifications/improvements. The new design contains two major improvements. Furthermore, some experimental results on studies of dielectronic recombination processes for highly charged Xe ions will be discussed.
Availability note (English)
Available from http://dx.doi.org/10.1088/1748-0221/5/08/C08011Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Instrumentation
- Journal Volume
- 5
- Journal Issue
- 08
- Journal Page Range
- p. C08011
- ISSN
- 1748-0221
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 42025195
- Subject category
- S43: PARTICLE ACCELERATORS;
- Descriptors DEI
- ATOMIC PHYSICS; ELECTRON BEAMS; ION SOURCES; LIGHT SOURCES; MAINTENANCE; SPECTROSCOPY; TRAPS; XENON IONS
- Descriptors DEC
- BEAMS; CHARGED PARTICLES; IONS; LEPTON BEAMS; PARTICLE BEAMS; PHYSICS; RADIATION SOURCES