Microwave absorption properties of easy-plane anisotropy Fe–Si powders with surface modification in the frequency range of 0.1–4 GHz
Creators
- 1. Lanzhou University, Institute of Applied Magnetics, Key Laboratory of Magnetism and Magnetic Materials of the Ministry of Education, Key Laboratory of Special Function Materials and Structure Design (China)
Description
To satisfy impedance matching at low frequencies and obtain high microwave absorption performance, easy-plane anisotropy Fe–Si powders coated with SiO2 were produced by a ball milling technique and a chemical deposition method. Then, a scanning electron microscope, a transmission electron microscope, an X-ray photoelectron spectrometer, an X-ray diffractometer, a Mössbauer spectrometer, a vibrating sample magnetometer, and a vector network analyzer were used to characterize the samples. Compared to easy-plane anisotropy Fe–Si powders without surface modification, the dielectric constant of easy-plane anisotropy Fe–Si powders with SiO2 coating decreased dramatically and the microwave absorption performance was improved significantly. The reflection loss peak reached − 10 dB when the thickness was 1.4 mm and even reached − 34 dB when the thickness was 4.5 mm, exhibiting great potential for application in thin absorbers working in the frequency range of 0.1–4 GHz. In addition, the microwave absorption performance at oblique incidence was also investigated. A reflection loss peak of − 30 dB was obtained when the incident angle was 30°, and a reflection loss peak of more than − 10 dB can still be obtained even when the incident angle was 80°. The results show that the easy-plane anisotropy Fe–Si powders with SiO2 coating still possess high microwave absorption performance at oblique incidence.
Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Materials Science. Materials in Electronics
- Journal Volume
- 30
- Journal Issue
- 14
- Journal Page Range
- p. 13810-13819
- ISSN
- 0957-4522
- CODEN
- JSMEEV
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 52024321
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ABSORPTION; ANISOTROPY; DIELECTRIC MATERIALS; LOSSES; MICROWAVE RADIATION; MODIFICATIONS; MOESSBAUER SPECTROMETERS; PEAKS; POWDERS; REFLECTION; SCANNING ELECTRON MICROSCOPY; SILICA; SILICON OXIDES; TRANSMISSION ELECTRON MICROSCOPY; VIBRATING SAMPLE MAGNETOMETERS; X-RAY DIFFRACTOMETERS; X-RAY PHOTOELECTRON SPECTROSCOPY; X-RAY SPECTROMETERS
- Descriptors DEC
- CHALCOGENIDES; DIFFRACTOMETERS; ELECTROMAGNETIC RADIATION; ELECTRON MICROSCOPY; ELECTRON SPECTROSCOPY; GAMMA SPECTROMETERS; MAGNETOMETERS; MATERIALS; MEASURING INSTRUMENTS; MICROSCOPY; MINERALS; OXIDE MINERALS; OXIDES; OXYGEN COMPOUNDS; PHOTOELECTRON SPECTROSCOPY; RADIATIONS; SILICON COMPOUNDS; SORPTION; SPECTROMETERS; SPECTROSCOPY
Optional Information
- Copyright
- Copyright (c) 2019 Springer Science+Business Media, LLC, part of Springer Nature