Published July 30, 2019 | Version v1
Journal article

Microwave absorption properties of easy-plane anisotropy Fe–Si powders with surface modification in the frequency range of 0.1–4 GHz

  • 1. Lanzhou University, Institute of Applied Magnetics, Key Laboratory of Magnetism and Magnetic Materials of the Ministry of Education, Key Laboratory of Special Function Materials and Structure Design (China)

Description

To satisfy impedance matching at low frequencies and obtain high microwave absorption performance, easy-plane anisotropy Fe–Si powders coated with SiO2 were produced by a ball milling technique and a chemical deposition method. Then, a scanning electron microscope, a transmission electron microscope, an X-ray photoelectron spectrometer, an X-ray diffractometer, a Mössbauer spectrometer, a vibrating sample magnetometer, and a vector network analyzer were used to characterize the samples. Compared to easy-plane anisotropy Fe–Si powders without surface modification, the dielectric constant of easy-plane anisotropy Fe–Si powders with SiO2 coating decreased dramatically and the microwave absorption performance was improved significantly. The reflection loss peak reached − 10 dB when the thickness was 1.4 mm and even reached − 34 dB when the thickness was 4.5 mm, exhibiting great potential for application in thin absorbers working in the frequency range of 0.1–4 GHz. In addition, the microwave absorption performance at oblique incidence was also investigated. A reflection loss peak of − 30 dB was obtained when the incident angle was 30°, and a reflection loss peak of more than − 10 dB can still be obtained even when the incident angle was 80°. The results show that the easy-plane anisotropy Fe–Si powders with SiO2 coating still possess high microwave absorption performance at oblique incidence.

Additional details

Identifiers

Publishing Information

Journal Title
Journal of Materials Science. Materials in Electronics
Journal Volume
30
Journal Issue
14
Journal Page Range
p. 13810-13819
ISSN
0957-4522
CODEN
JSMEEV

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Copyright (c) 2019 Springer Science+Business Media, LLC, part of Springer Nature