Published December 11, 2010 | Version v1
Journal article

Development of an integrated response generator for Si/CdTe semiconductor Compton cameras

  • 1. Department of Physics, Graduate School of Science, University of Tokyo, Hongo 7-3-1, Bunkyo 113-0033 (Japan)
  • 2. Department of High Energy Astrophysics, Institute of Space and Astronautical Science (ISAS), Japan Aerospace Exploration Agency (JAXA), 3-1-1 Yoshinodai, Sagamihara 229-8510 (Japan)
  • 3. Department of Space and Astronautical Science, The Graduate University for Advanced Studies, 3-1-1 Yoshinodai, Sagamihara 229-8510 (Japan)

Description

We have developed an integrated response generator based on Monte Carlo simulation for Compton cameras composed of silicon (Si) and cadmium telluride (CdTe) semiconductor detectors. In order to construct an accurate detector response function, the simulation is required to include a comprehensive treatment of the semiconductor detector devices and the data processing system in addition to simulating particle tracking. Although CdTe is an excellent semiconductor material for detection of soft gamma rays, its ineffective charge transport property distorts its spectral response. We investigated the response of CdTe pad detectors in the simulation and present our initial results here. We also performed the full simulation of prototypes of Si/CdTe semiconductor Compton cameras and report on the reproducibility of detection efficiencies and angular resolutions of the cameras, both of which are essential performance parameters of astrophysical instruments.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.nima.2009.11.052

Additional details

Identifiers

DOI
10.1016/j.nima.2009.11.052;
PII
S0168-9002(09)02257-8;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
Journal Volume
624
Journal Issue
2
Journal Page Range
p. 303-309
ISSN
0168-9002
CODEN
NIMAER

Conference

Title
11. european symposium on semiconductor detectors
Dates
7-11 Jun 2009
Place
Wildbad Kreuth (Germany)

Optional Information

Copyright
Copyright (c) 2009 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.