Published March 15, 2001 | Version v1
Journal article Metadata-only

A two-detector anticoincidence system for reduction of Compton scattered high energy γ-ray background in PIXE analysis

Creators

  • 1. Marburg Univ. (Germany, F.R.). Fachbereich Physik

Description

A Si(Li)/CsI(T1) two-detector anticoincidence system, applied for background suppression in X-ray spectra, is described. Since the high energy background in PIXE spectra is produced mainly by Compton scattering of γ-rays in the Si(Li) detector, the anticoincidence spectrometer can be used to improve the sensitivity of PIXE analysis for trace elements of higher atomic number (Mo, Cd, I). Details of the system and the performance of the spectrometer are presented. (orig.)

Additional details

Publishing Information

Journal Title
Nucl. Instrum. Methods
Journal Volume
181
Journal Issue
1-3
Series
Nucl. Instrum. Methods.
Journal Page Range
25-29
ISSN
0029-554X

Conference

Title
2. International conference on particle induced X-ray emission and its analytical applications (PIXE-2).
Dates
9 - 12 Jun 1980.
Place
Lund, Sweden.

INIS

Country of Publication
Netherlands
Country of Input or Organization
Netherlands
INIS RN
12626342
Subject category
S73: NUCLEAR PHYSICS AND RADIATION PHYSICS;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ANTICOINCIDENCE; BACKGROUND RADIATION; COMPTON EFFECT; COUNTING TECHNIQUES; LI-DRIFTED SI DETECTORS; X-RAY EMISSION ANALYSIS; X-RAY SPECTRA
Descriptors DEC
BASIC INTERACTIONS; CHEMICAL ANALYSIS; ELASTIC SCATTERING; ELECTROMAGNETIC INTERACTIONS; INTERACTIONS; LI-DRIFTED DETECTORS; MEASURING INSTRUMENTS; NONDESTRUCTIVE ANALYSIS; RADIATION DETECTORS; RADIATIONS; SCATTERING; SEMICONDUCTOR DETECTORS; SI SEMICONDUCTOR DETECTORS; SPECTRA