Probabilistic description of particle transport. II. Analysis of low-energy electron transmission through thin solid Xe and N2 films

The probabilistic description of quasielastic particle transport given in a previous paper is used to analyze the results of low-energy electron transmission experiments on thin solid xenon and molecular nitrogen films deposited on a metal substrate. Values of the entrance probabilities of the incident electrons at the vacuum-film interface and of the electron scattering mean free paths in the films are extracted in the electron energy range 1.6--7.9 eV for xenon, and 2.4--7.4 eV for molecular nitrogen. The effects of anisotropy in the surface scattering and in the reflections at the two interfaces of the films are also discussed