Published December 1986 | Version v1
Report

Topometric interferometry

Description

Characterization of convex spherical surfaces accurately, quickly, and reliably has been attained by applying the principles of topometric interferometry. A topometric interferometer can provide graphical and numerical information on surface height over an extended area. This article describes the design, construction, and test of a prototype instrument for inspection of spherical surfaces with diameters between 1 and 15.5 mm

Additional details

Publishing Information

Imprint Title
Mechanical Engineering Department engineering research: Annual report, FY 1986
Journal Page Range
p. 52-62.
Report number
UCID--19323-86

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
18100857
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Descriptors DEI
ACCURACY; CALIBRATION; FABRICATION; INTERFEROMETERS; LASERS; OPERATION; PERFORMANCE TESTING; SPECIFICATIONS; SPHERES; SURFACES; THIN FILMS; TOPOLOGY
Descriptors DEC
AMPLIFIERS; EQUIPMENT; FILMS; MATHEMATICS; MEASURING INSTRUMENTS; TESTING