Current-voltage characteristics of diluted Josephson-junction arrays: Scaling behavior at current and percolation threshold
Creators
- 1. Laboratorio Associado de Sensores e Materiais, Instituto Nacional de Pesquisas Espaciais, 12201 Sao Jose dos Campos, Sao Paulo (Brazil)
- 2. Centro Atomico Bariloche, 8400 San Carlos de Bariloche, Rio Negro (Argentina)
Description
Dynamical simulations and scaling arguments are used to study the current-voltage (I-V) characteristics of a two-dimensional model of resistively shunted Josephson-junction arrays in presence of percolative disorder, at zero external field. Two different limits of the Josephson-coupling concentration p are considered, where pc is the percolation threshold. For p>pc and zero temperature, the I-V curves show power-law behavior above a disorder-dependent critical current. The power-law behavior and critical exponents are consistent with a simple scaling analysis. At pc and finite temperature T, the results show the scaling behavior of a T=0 superconducting transition. The resistance is linear but vanishes for decreasing T with an apparent exponential behavior. Crossover to nonlinearity appears at currents proportional to T1+νT, with a thermal-correlation length exponent νT consistent with the corresponding value for the diluted XY model at pc. copyright 1997 The American Physical Society
Additional details
Publishing Information
- Journal Title
- Physical Review. B, Condensed Matter
- Journal Volume
- 56
- Journal Issue
- 22
- Journal Page Range
- p. 14671-14676.
- ISSN
- 0163-1829
- CODEN
- PRBMDO
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 29012483
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- ELECTRIC CONDUCTIVITY; JOSEPHSON EFFECT; JOSEPHSON JUNCTIONS; SCALING LAWS; SIMULATION
- Descriptors DEC
- ELECTRICAL PROPERTIES; PHYSICAL PROPERTIES; SEMICONDUCTOR JUNCTIONS