Application of the ion beam emitted from plasma focus device for target activation
Creators
- 1. Inst. Plasma Physics and Laser Microfusion, Hery 23, P.O.B. 49, 00-908 Warsaw (Poland)
- 2. The Andrzej Soltan Institute for Nuclear Studies, 05-400 Otwock-Swierk (Poland)
Description
The paper reports on experimental results and numerical studies of a possibility of the application of ion beams emitted from plasma focus discharges for target activation. The complete data obtained from the activation of a carbon target and also numerical prognoses for the 13N isotope production are presented. Deuterons emitted from a plasma focus facility bombarded a carbon target and they produced positron-emitting isotopes. Gamma quanta with energy 511 keV were obtained from annihilation of positron-electron pairs. Gamma spectrometry has been used to measure the induced activity. The activity of isotopes was determined using a multichannel analyzer and a high purity germanium detector. The activity of the 13N isotope was of the order of tens of thousands Bq and was compared with that obtained by numerical estimation (Authors)
Additional details
Publishing Information
- Journal Title
- Acta Physica Slovaca
- Journal Volume
- 54
- Journal Issue
- 4
- Journal Page Range
- p. 401-407
- ISSN
- 0323-0465
- CODEN
- APSVCO
INIS
- Country of Publication
- Slovakia
- Country of Input or Organization
- Slovakia
- INIS RN
- 36001069
- Subject category
- S73: NUCLEAR PHYSICS AND RADIATION PHYSICS; S70: PLASMA PHYSICS AND FUSION TECHNOLOGY;
- Descriptors DEI
- ANNIHILATION; CARBON 12 TARGET; CARBON 13 TARGET; CARBON 16 TARGET; COINCIDENCE SPECTROMETRY; DEUTERON BEAMS; ELECTRON PAIRS; GAMMA SPECTROSCOPY; HIGH-PURITY GE DETECTORS; ION BEAMS; NUMERICAL ANALYSIS; PLASMA FOCUS; POSITRONS
- Descriptors DEC
- ANTILEPTONS; ANTIMATTER; ANTIPARTICLES; BEAMS; COINCIDENCE METHODS; COUNTING TECHNIQUES; ELEMENTARY PARTICLES; FERMIONS; GE SEMICONDUCTOR DETECTORS; INTERACTIONS; ION BEAMS; LEPTONS; MATHEMATICS; MATTER; MEASURING INSTRUMENTS; PARTICLE INTERACTIONS; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS; SPECTROSCOPY; TARGETS
Optional Information
- Notes
- 5 refs., 3 figs.