Influence of substrate induced strain on B-site ordering and magnetic properties of Nd2NiMnO6 epitaxial thin films
Creators
- 1. Nanoscience Laboratory, Institute Instrumentation Centre, Indian Institute of Technology Roorkee, Uttarakhand 247667 (India)
- 2. Department of Physics, D.B.S. PG College, Dehradun 248001, Uttarakhand (India)
Description
Epitaxial thin films of double perovskite Nd2NiMnO6 (NNMO) have been successfully grown on (001) oriented substrates of (LaAlO3)0.3-(Sr2AlTaO6)0.7 (LSAT), SrTiO3 (STO) and LaAlO3 (LAO) by pulsed laser deposition under optimum growth conditions. X-Ray diffraction and reciprocal space maps of the asymmetric (103) peak reveal that the films deposited on LSAT and STO substrates are fully relaxed, while a large in- plane compressive strain has been observed in film grown on LAO. This results into the coexistence of anti-site disorder and orthorhombic phase in the film deposited on LAO, which is further confirmed from observed shift and broadening in the antisymmetric vibrations in the Raman spectra. The temperature dependent magnetization shows a ferromagnetic transition close to 200 K in all the three samples. However, film grown on LAO substrate shows an additional upturn transition at ~ 96 K (T′), which could be ascribed to the formation of antisite disorders further responsible for reduction of saturation magnetization (~ 1.8 × 105 A/m) in hysteresis curve of the sample. The ordered structure obtained on LSAT and STO exhibit in-plane easy axis with a large coercivity of ~ 0.2 T, while, the film deposited on LAO does not show any preferred anisotropic direction. - Highlights: • Epitaxial Nd2NiMnO6 thin films were deposited by pulsed laser deposition. • Reciprocal space maps reveal the strained or relaxed state of thin films. • B-site ordering or disordering in the films was confirmed by Raman spectroscopy. • All the films show a ferromagnetic transition close to 200 K. • Magnetic hysteresis loops suggest the magnetic anisotropic direction.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.tsf.2017.03.048Additional details
Identifiers
- DOI
- 10.1016/j.tsf.2017.03.048;
- PII
- S0040-6090(17)30233-X;
Publishing Information
- Journal Title
- Thin Solid Films
- Journal Volume
- 629
- Journal Page Range
- p. 49-54
- ISSN
- 0040-6090
- CODEN
- THSFAP
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 50023909
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ALUMINATES; DEPOSITS; ENERGY BEAM DEPOSITION; LANTHANUM OXIDES; LASER RADIATION; MAGNETIC PROPERTIES; ORTHORHOMBIC LATTICES; PEROVSKITE; PULSED IRRADIATION; RAMAN SPECTRA; RAMAN SPECTROSCOPY; STRONTIUM TITANATES; THIN FILMS; X-RAY DIFFRACTION
- Descriptors DEC
- ALKALINE EARTH METAL COMPOUNDS; ALUMINIUM COMPOUNDS; CHALCOGENIDES; COHERENT SCATTERING; CRYSTAL LATTICES; CRYSTAL STRUCTURE; DEPOSITION; DIFFRACTION; ELECTROMAGNETIC RADIATION; FILMS; IRRADIATION; LANTHANUM COMPOUNDS; LASER SPECTROSCOPY; MINERALS; OXIDE MINERALS; OXIDES; OXYGEN COMPOUNDS; PEROVSKITES; PHYSICAL PROPERTIES; RADIATIONS; RARE EARTH COMPOUNDS; SCATTERING; SPECTRA; SPECTROSCOPY; STRONTIUM COMPOUNDS; SURFACE COATING; THREE-DIMENSIONAL LATTICES; TITANATES; TITANIUM COMPOUNDS; TRANSITION ELEMENT COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2017 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.