Published 2005
| Version v1
Journal article
Determination of the lattice constant of epitaxial CuIn1-xGaxS2 films on Si(111) by means of synchrotron radiation
Creators
- 1. Inst. fuer Festkoeperphysik, Friedrich Schiller Univ. Jena (Germany)
- 2. Inst. fuer Optik und Quantenelektronik, Friedrich Schiller Univ. Jena (Germany)
Description
no abstract available
Additional details
Additional titles
- Original title (German)
- Bestimmung der Gitterkonstanten epitaktischer CuIn
Publishing Information
- Journal Title
- Verhandlungen der Deutschen Physikalischen Gesellschaft
- Journal Volume
- 40
- Journal Issue
- 2
- Journal Page Range
- p. 334
- ISSN
- 0420-0195
- CODEN
- VDPEAZ
Conference
- Title
- Physics since Albert Einstein
- Original Conference Title
- Jahrestagung 2005 der Deutschen Physikalischen Gesellschaft (DPG) im World Year of Physics: Physik seit Albert Einstein
- Acronym
- 2005 annual conference of the German Physical Society (DPG) during the World year of physics
- Dates
- 4-9 Mar 2005
- Place
- Berlin (Germany)
INIS
- Country of Publication
- Germany
- Country of Input or Organization
- Germany
- INIS RN
- 36088229
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference, No Abstract
- Descriptors DEI
- COPPER SULFIDES; FILMS; GALLIUM SULFIDES; INDIUM SULFIDES; LATTICE PARAMETERS; MOLECULAR BEAM EPITAXY; SILICON; SUBSTRATES; SURFACES; TETRAGONAL LATTICES; X-RAY DIFFRACTION
- Descriptors DEC
- CHALCOGENIDES; COHERENT SCATTERING; COPPER COMPOUNDS; CRYSTAL GROWTH METHODS; CRYSTAL LATTICES; CRYSTAL STRUCTURE; DIFFRACTION; ELEMENTS; EPITAXY; GALLIUM COMPOUNDS; INDIUM COMPOUNDS; SCATTERING; SEMIMETALS; SULFIDES; SULFUR COMPOUNDS; TRANSITION ELEMENT COMPOUNDS